High level fault injection for attack simulation in smart cards

Proceedings of the Asian Test Symposium

Volumn , Issue , 2004, Pages 118-121

  Rothbart, K ^a   Neffe, U ^a   Steger, Ch ^a   Weiss, R ^a   Rieger, E ^b   Muehlberger, A ^b  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT INJECTION; FAULTY SMART CARD DESIGN; FLIP SINGLE BITS; FOCUSED ION BEAMS (FIB);

COMPUTER SIMULATION; FAULT TREE ANALYSIS; ION BEAMS; KNOWLEDGE ACQUISITION; PRODUCT DESIGN; ROBUSTNESS (CONTROL SYSTEMS); SEMICONDUCTOR MATERIALS; SHAPE MEMORY EFFECT; SYSTEMS ANALYSIS;

SMART CARDS;

EID: 13244289780     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2004.48     Document Type: Conference Paper

References (7)

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