System-level dependability analysis with RT-level fault injection accuracy

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2004, Pages 451-458

  Leveugle, R ^a   Cimonnet, D ^a   Amman, A ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT FUNCTIONS; HIGH-LEVEL MODELING; INTERNAL REGISTERS; SYSTEM-LEVEL MODELING;

ERROR ANALYSIS; FAILURE ANALYSIS; MATHEMATICAL MODELS;

NETWORKS (CIRCUITS);

EID: 24944432435     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.2004.1347870     Document Type: Conference Paper

References (2)

1. F. Corno, S. Tosato, P. Gabrielli, "System-level analysis of fault effects in an automotive environment", "The 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Boston, Massachusetts, USA, November 3-5, 2003", IEEE Computer Society Press, Los Alamitos, California, 2003, pp. 529-536
2. R. Marawar, G. Edelmon, C. Nybro, S. Duncan, C. Britton, "Combining the use of Multisim and Lab VIEW for Circuit Design and Analysis in Undergraduate Electronics Curriculum" http://www.electronicsworkbench.com/ pdf/msmlabvw.pdf