Characterization of the dielectric properties of covalently attached organic films on silicon surfaces

Thin Solid Films

Volumn 519, Issue 19, 2011, Pages 6472-6479

  Shamsi, Fahimeh ^a   Coster, Hans ^a   Chilcott, Terry ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

Author keywords

1 Ethyl 3 (3 dimethylaminopropyl) carbodiimide; Electrical impedance spectroscopy; Ellipsometry; Methyl undecanoate; Monolayer; N hydroxysuccinimide; X ray photoelectric spectroscopy

Indexed keywords

CARBODIIMIDES; ELECTRICAL IMPEDANCE SPECTROSCOPY; METHYL-UNDECANOATE; N-HYDROXYSUCCINIMIDE; X-RAY PHOTOELECTRIC SPECTROSCOPY;

CARBOXYLIC ACIDS; CHEMICAL MODIFICATION; DIELECTRIC PROPERTIES; ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT; ELECTROCHEMICAL CORROSION; ELLIPSOMETRY; ESTERIFICATION; ESTERS; MONOLAYERS; PHOTOELECTRICITY; SELF ASSEMBLY; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOELECTRON SPECTROSCOPY;

EID: 79958242992     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.04.217     Document Type: Article

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