Structural characterization of organic multilayers on silicon (111) formed by immobilization of molecular films on functionalized Si-C linked monolayers

Langmuir

Volumn 20, Issue 21, 2004, Pages 9227-9235

  Böcking, Till ^a   James, Michael ^b   Coster, Hans G L ^a   Chilcott, Terry C ^a   Barrow, Kevin D ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; HYDROLYSIS; MOLECULAR DYNAMICS; MONOLAYERS; MULTILAYERS; THERMOANALYSIS; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

MOLECULAR FILMS; MOLECULAR LAYERS; SILICON DIOXIDES; X RAY REFLECTIVITY;

SILICON;

ALKENE; CARBON; ORGANOSILICON DERIVATIVE; SILICON;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMICAL STRUCTURE; CHEMISTRY; IMMOBILIZATION; RADIATION EXPOSURE; SURFACE PROPERTY; SYNTHESIS;

ALKENES; CARBON; IMMOBILIZATION; MEMBRANES, ARTIFICIAL; MOLECULAR STRUCTURE; ORGANOSILICON COMPOUNDS; SILICON; SURFACE PROPERTIES;

HYDROLYSIS; MONOLAYERS; MULTILAYERS; PHOTOELECTRONS; SILICON; THERMAL ANALYSIS; ULTRAVIOLET RADIATION; X RAY ANALYSIS;

EID: 6444242702     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la048474p     Document Type: Article

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