Novel algorithms for fast statistical analysis of scaled circuits

Lecture Notes in Electrical Engineering

Volumn 46 LNEE, Issue , 2009, Pages 1-191

  Singhee, Amith ^a   Rutenbar, Rob A ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78651587182     PISSN: 18761100     EISSN: 18761119     Source Type: Book Series    
DOI: 10.1007/978-90-481-3100-6_1     Document Type: Conference Paper

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