Statistical Analysis of Subthreshold Leakage Current for VLSI Circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 12, Issue 2, 2004, Pages 131-139

  Rao, Rajeev ^a   Srivastava, Ashish ^a   Blaauw, David ^a   Sylvester, Dennis ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Estimation; Leakage currents; Monte Carlo; Probability; Process variability

Indexed keywords

BENCHMARKING; COMPUTER SIMULATION; INTEGRATED CIRCUITS; LEAKAGE CURRENTS; MATHEMATICAL MODELS; MONTE CARLO METHODS; MOSFET DEVICES; PROBABILITY DENSITY FUNCTION; THRESHOLD VOLTAGE;

MONTE CARLO; PROCESS VARIABILITY;

VLSI CIRCUITS;

EID: 1642276264     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2003.821549     Document Type: Conference Paper

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