Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events

Proceedings - Design Automation Conference

Volumn , Issue , 2006, Pages 69-72

  Kanj, Rouwaida ^a   Joshi, Rajiv ^b   Nassif, Sani ^a  

^a IBM AUSTIN RESEARCH LABORATORY   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

SRAM; Statistical performance analysis; Yield prediction

Indexed keywords

COMPUTATIONAL EFFICIENCY; COMPUTER AIDED ANALYSIS; COMPUTER AIDED DESIGN; COMPUTER SYSTEM RECOVERY; MONTE CARLO METHODS;

STATISTICAL PERFORMANCE ANALYSIS; YIELD PREDICTION;

STATIC RANDOM ACCESS STORAGE;

EID: 34547208344     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1146909.1146930     Document Type: Conference Paper

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