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Volumn 2005, Issue , 2005, Pages 720-726

Projection-based performance modeling for inter/intra-die variations

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; ITERATIVE METHODS; LINEAR EQUATIONS; MATHEMATICAL MODELS; NETWORKS (CIRCUITS);

EID: 33751436870     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2005.1560160     Document Type: Conference Paper
Times cited : (48)

References (12)
  • 1
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    • Nassif, S.1
  • 2
    • 1342287051 scopus 로고    scopus 로고
    • Characterization of spatial intrafield gate CD variability, its impact on circuit performance, and spatial mask-level correction
    • Feb.
    • M. Orshansky; L. Milor and C. Hu, "Characterization of spatial intrafield gate CD variability, its impact on circuit performance, and spatial mask-level correction," IEEE Trans. Semiconductor Manufacturing, vol. 17, no. 1, pp. 2-11, Feb. 2004.
    • (2004) IEEE Trans. Semiconductor Manufacturing , vol.17 , Issue.1 , pp. 2-11
    • Orshansky, M.1    Milor, L.2    Hu, C.3
  • 4
    • 0026819378 scopus 로고
    • Statistical modeling of device mismatch for analog MOS integrated circuits
    • Feb.
    • C. Michael and M. Ismail, "Statistical modeling of device mismatch for analog MOS integrated circuits," IEEE Journal of Solid-State Circuits, vol. 27, no. 2, pp. 154-166, Feb. 1992.
    • (1992) IEEE Journal of Solid-state Circuits , vol.27 , Issue.2 , pp. 154-166
    • Michael, C.1    Ismail, M.2
  • 5
    • 0027969744 scopus 로고
    • An efficient yield optimization method using a two step linear approximation of circuit performance
    • Z. Wang and S. Director, "An efficient yield optimization method using a two step linear approximation of circuit performance," IEEE EDAC, pp. 567-571, 1994.
    • (1994) IEEE EDAC , pp. 567-571
    • Wang, Z.1    Director, S.2
  • 6
    • 0029289926 scopus 로고
    • Worse-case analysis and optimization of VLSI circuit performance
    • Apr.
    • A. Dharchoudhury and S. Kang, "Worse-case analysis and optimization of VLSI circuit performance," IEEE Trans. CAD, vol. 14, no. 4, pp. 481-492, Apr. 1995.
    • (1995) IEEE Trans. CAD , vol.14 , Issue.4 , pp. 481-492
    • Dharchoudhury, A.1    Kang, S.2
  • 7
    • 16244393708 scopus 로고    scopus 로고
    • Asymptotic probability extraction for non-Normal distributions of circuit performance
    • X. Li, J. Le, P. Gopalakrishnan and L. Pileggi, "Asymptotic probability extraction for non-Normal distributions of circuit performance," IEEE ICCAD, pp. 2-9, 2004.
    • (2004) IEEE ICCAD , pp. 2-9
    • Li, X.1    Le, J.2    Gopalakrishnan, P.3    Pileggi, L.4
  • 10
    • 0024931842 scopus 로고
    • An efficient methodology for building macromodels of IC fabrication processes
    • Dec.
    • K. Low and S. Director, "An efficient methodology for building macromodels of IC fabrication processes," IEEE Trans. CAD, vol. 8, no. 12, pp. 1299-1313, Dec. 1989.
    • (1989) IEEE Trans. CAD , vol.8 , Issue.12 , pp. 1299-1313
    • Low, K.1    Director, S.2
  • 12
    • 0018468345 scopus 로고
    • A comparison of three methods for selecting values of input variables in the analysis of output from a computer code
    • May.
    • M. Mckay, R. Beckman and W. Conover, "A comparison of three methods for selecting values of input variables in the analysis of output from a computer code," Technometrics, vol. 21, no. 2, pp. 239-245, May. 1979.
    • (1979) Technometrics , vol.21 , Issue.2 , pp. 239-245
    • Mckay, M.1    Beckman, R.2    Conover, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.