Hard X-ray focusing with curved reflective multilayers

X-Ray Optics and Instrumentation

Volumn 2010, Issue , 2010, Pages

  Morawe, Christian ^a   Osterhoff, Markus ^a,b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957855884     PISSN: 16877632     EISSN: 16877640     Source Type: Journal    
DOI: 10.1155/2010/479631     Document Type: Review

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