Aberrations in curved x-ray multilayers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7077, Issue , 2008, Pages

  Morawe, Ch ^a   Guigay, J P ^a   Mocella, V ^a,b   Ferrero, C ^a   Mimura, H ^c   Handa, S ^c   Yamauchi, K ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b CNR   (Italy)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

Aberrations; Nano focusing; X ray multilayers; X ray optics

Indexed keywords

ABERRATIONS; FOCUSING; OPTICAL PROPERTIES; RAY TRACING; REFRACTIVE INDEX;

ANALYTICAL APPROACHES; FIRST ORDERS; FOCUSING PROPERTIES; HARD X RAYS; MULTILAYER MIRRORS; NANO-FOCUSING; REFRACTION EFFECTS; X-RAY MULTILAYERS; X-RAY OPTICS;

MULTILAYERS;

EID: 56249135927     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.794534     Document Type: Conference Paper

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