SCOPUS 정보 검색 플랫폼

Volumn 16, Issue 20, 2008, Pages 16138-16150

An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 2. Interpretation and application to focusing experiments

(4) Morawe, Ch a Guigay, J P a Mocella, V b Ferrero, C a

a EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

b CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS;

ANALYTICAL APPROACH; CURVED MULTILAYER MIRRORS; FOCAL SPOT; FOCUSING PROPERTIES; FUNDAMENTAL LIMITATIONS; MULTI-LAYER MIRRORS; MULTILAYER OPTICS; POTENTIAL IMPACTS;

MULTILAYERS;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT DESIGN; INSTRUMENTATION; OPTICS; SYNCHROTRON; THEORETICAL MODEL; X RAY;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; MODELS, THEORETICAL; OPTICS; SYNCHROTRONS; X-RAYS;

EID: 54749129485 PISSN: None EISSN: 10944087 Source Type: Journal
DOI: 10.1364/OE.16.016138 Document Type: Article

Times cited : (26)

References (7)

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- and references therein
- J-P. Guigay, Ch. Morawe, V. Mocella, C. Ferrero, "An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 1. Derivation of caustic shapes," Opt. Express 16, 12050-12059 (2008) and references therein.
- (2008) Opt. Express , vol.16 , pp. 12050-12059
- Guigay, J.-P.¹ Morawe, C.² Mocella, V.³ Ferrero, C.⁴

2
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- Reflective optics for sub-10nm hard X-ray focusing
- H. Mimura, S. Matsuyama, H. Yumoto, S. Handa, T. Kimura, Y. Sano, K. Tamasaku, Y. Nishino, M. Yabashi, T. Ishikawa, K. Yamauchi, "Reflective optics for sub-10nm hard X-ray focusing," Proc. SPIE 6705, 67050L (2007).
- (2007) Proc. SPIE , vol.6705
- Mimura, H.¹ Matsuyama, S.² Yumoto, H.³ Handa, S.⁴ Kimura, T.⁵ Sano, Y.⁶ Tamasaku, K.⁷ Nishino, Y.⁸ Yabashi, M.⁹ Ishikawa, T.¹⁰ Yamauchi, K.¹¹

3
- 84894003996
- H. Mimura, S. Handa, K. Yamauchi, Department of Precision Science and Technology, Graduate School, of Engineering, Osaka University, Japan (personal communication, 2008)
- H. Mimura, S. Handa, K. Yamauchi, Department of Precision Science and Technology, Graduate School, of Engineering, Osaka University, Japan (personal communication, 2008)

4
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- Surface studies of solids by total reflection of x-rays
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- (1954) Phys. Rev , vol.45 , pp. 359
- Parratt, L.G.¹

5
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- Graded multilayers for focusing hard x rays below 50 nm
- Ch. Morawe, O. Hignette, P. Cloetens, W. Ludwig, Ch. Borel, P. Bernard, A. Rommeveaux, "Graded multilayers for focusing hard x rays below 50 nm," Proc. SPIE 6317, 63170F (2006).
- (2006) Proc. SPIE , vol.6317
- Morawe, C.¹ Hignette, O.² Cloetens, P.³ Ludwig, W.⁴ Borel, C.⁵ Bernard, P.⁶ Rommeveaux, A.⁷

6
- 21844468471
- Parallel beam coupling into channel-cut monochromators using curved graded multilayers
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- Schuster, M.¹ Göbel, H.²

7
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- Design and performance of graded multilayers as focusing elements for x-ray optics
- Ch. Morawe, P. Pecci, J-Ch. Peffen, E. Ziegler, "Design and performance of graded multilayers as focusing elements for x-ray optics," Rev. Sci. Instrum. 70, 3227 (1999).
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- Morawe, C.¹ Pecci, P.² Peffen, J.-C.³ Ziegler, E.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.