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Japanese Journal of Applied Physics, Part 2: Letters

Volumn 44, Issue 16-19, 2005, Pages

Hard X-ray diffraction-limited nanofocusing with kirkpatrick-baez mirrors

(14) Mimura, Hidekazu a Matsuyama, Satoshi a Yumoto, Hirokatsu a Hara, Hideyuki a Yamamura, Kazuya a Sano, Yasuhisa a Shibahara, Masafumi b Endo, Katsuyoshi a Mori, Yuzo a Nishlno, Yoshinori c Tamasaku, Kenji c Yabashi, Makina d Ishikawa, Tetsuya c,d Yamauchi, Kazuto a

a OSAKA UNIVERSITY (Japan)

b HYOGO PREFECTURAL INSTITUTE OF TECHNOLOGY (Japan)

c RIKEN (Japan)

d JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

Author keywords

Diffraction limited focusing; EEM; Focusing mirror; Hard x ray; Kirkpatrick baez mirrors; MSI; Nanofocusing; Plasma CVM; RADSI

Indexed keywords

FOCUSING; LASER BEAMS; X RAY DIFFRACTION ANALYSIS;

FOCUSING MIRRORS; HARD X-RAYS; NANOFOCUSING;

MIRRORS;

EID: 30544432038 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.44.L539 Document Type: Article

Times cited : (121)

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