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Volumn 879, Issue , 2007, Pages 764-769

Graded multilayers for synchrotron optics

Author keywords

Focusing; Multilayers; Synchrotron radiation; Thickness gradient; X ray optics

Indexed keywords


EID: 33947395564     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2436173     Document Type: Conference Paper
Times cited : (16)

References (23)
  • 10
    • 33947396546 scopus 로고    scopus 로고
    • Ch. Morawe, J-Ch. Peffen, E.M. Dufresne, Y.S. Chu, A.T. Macrander, SPIE Proceedings 5195, l (2003).
    • Ch. Morawe, J-Ch. Peffen, E.M. Dufresne, Y.S. Chu, A.T. Macrander, SPIE Proceedings 5195, l (2003).
  • 11
    • 0000266502 scopus 로고
    • Distributed Electron Cyclotron Resonance (DECR) Plasmas
    • edited by M. Moisanand J. Flletier, Amsterdam: Elsevier
    • M. Pichot, J. Pelletier, "Distributed Electron Cyclotron Resonance (DECR) Plasmas," in Microwave Exited Plasmas, edited by M. Moisanand J. Flletier, Amsterdam: Elsevier, 1992, pp. 419-434.
    • (1992) Microwave Exited Plasmas , pp. 419-434
    • Pichot, M.1    Pelletier, J.2
  • 20
    • 33947367575 scopus 로고    scopus 로고
    • Ultra-trace Analysis of Contaminants on Silicon Wafer Surfaces: The Development of a SR-TXRF Facility at the ESRF
    • Ph.D. Thesis, Université Joseph Fourier, Grenoble
    • G. Apostolo, "Ultra-trace Analysis of Contaminants on Silicon Wafer Surfaces: The Development of a SR-TXRF Facility at the ESRF", Ph.D. Thesis, Université Joseph Fourier, Grenoble, 2001.
    • (2001)
    • Apostolo, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.