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Volumn 90, Issue 14, 2007, Pages
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Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM ALLOYS;
DETECTORS;
DIFFRACTION PATTERNS;
MIRRORS;
X RAY MICROSCOPES;
X RAYS;
FRESNEL DIFFRACTION;
KIRKPATRICK-BAEZ OPTICS;
MEDIUM-RESOLUTION DETECTOR;
PHASE RETRIEVAL;
ZOOMING;
OPTICAL TOMOGRAPHY;
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EID: 34047248212
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2719653 Document Type: Article |
Times cited : (167)
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References (11)
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