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Volumn 90, Issue 14, 2007, Pages

Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; DETECTORS; DIFFRACTION PATTERNS; MIRRORS; X RAY MICROSCOPES; X RAYS;

EID: 34047248212     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2719653     Document Type: Article
Times cited : (167)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.