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Volumn 92, Issue 21, 2008, Pages

Hard x-rays nanoscale fluorescence imaging of Earth and Planetary science samples

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE RESOLUTION; MICROMETERS; NASA; PLANETARY SURFACE ANALYSIS; TRACE ELEMENTS; X RAY OPTICS;

EID: 44449119096     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2927476     Document Type: Article
Times cited : (19)

References (31)
  • 9
    • 12044254768 scopus 로고
    • E. Ito, Science 262, 370 (1993).
    • (1993) Science , vol.262 , pp. 370
    • Ito, E.1
  • 15
    • 33845700757 scopus 로고    scopus 로고
    • G. J. Flynn, Science 314, 1731 (2006).
    • (2006) Science , vol.314 , pp. 1731
    • Flynn, G.J.1
  • 28
    • 44449151246 scopus 로고
    • Ph.D. thesis, Massachusetts Inst. Tech., Cambridge, MA.
    • P. Boisseau, Ph.D. thesis, Massachusetts Inst. Tech., Cambridge, MA, 1986.
    • (1986)
    • Boisseau, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.