Ray-tracing analysis in aberration of a laterally- graded multilayer mirror

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 616, Issue 2-3, 2010, Pages 251-254

  Mimura, Hidekazu ^a,b   Handa, Soichiro ^a   Morawe, Christian ^c   Yokoyama, Hikaru ^a   Kimura, Takashi ^a   Matsuyama, Satoshi ^a   Yamauchi, Kazuto ^a  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Hard X ray focusing; Laterally graded multilayer mirror; Ray tracing

Indexed keywords

CURVED SURFACES; FOCAL POINTS; FOCUSED BEAMS; FOCUSING ELEMENTS; GRADED MULTILAYER MIRRORS; HARD-X-RAY FOCUSING; MULTI-LAYER MIRRORS; MULTILAYER STRUCTURES; NANOMETER SIZE; X RAY BEAM;

ABERRATIONS; COMMUNICATION CHANNELS (INFORMATION THEORY); FOCUSING; MIRRORS; MULTILAYER FILMS; MULTILAYERS; RAY TRACING;

X RAYS;

EID: 77950846988     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.11.050     Document Type: Article

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