An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 1. Derivation of caustic shapes

Optics Express

Volumn 16, Issue 16, 2008, Pages 12050-12059

  Guigay, J P ^a   Morawe, Ch ^a   Mocella, V ^b   Ferrero, C ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MULTILAYERS; RAY TRACING; REFRACTIVE INDEX;

ANALYTICAL APPROACH; ANALYTICAL RESULTS; FOCUSING PROPERTIES; MULTILAYER OPTICS; PARABOLIC SOLUTIONS; PARAMETRIC EQUATION; REFRACTION EFFECTS; WEAK INTERACTIONS;

LIGHT;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; OPTICS; THEORETICAL MODEL; X RAY;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MODELS, THEORETICAL; OPTICS; X-RAYS;

EID: 49149086342     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.012050     Document Type: Article

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