Trace signal selection for visibility enhancement in post-silicon validation

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2009, Pages 1338-1343

  Xiao, Liu ^a   Qiang, Xu ^a,b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARK CIRCUIT; INTEGRATED CIRCUIT DESIGNS; NORMAL OPERATIONS; POST-SILICON; SILICON DEBUG; TRACE-SIGNAL SELECTION;

AUTOMATION; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUITS; VISIBILITY;

DESIGN;

EID: 70350062059     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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