On bypassing blocking bugs during post-silicon validation

Proceedings - 13th IEEE European Test Symposium, ETS 2008

Volumn , Issue , 2008, Pages 69-74

  Daoud, Ehab Anis ^a   Nicolici, Nicola ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EUROPEAN; POST-SILICON; SILICON VERIFICATION;

SILICON;

EID: 51549089377     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2008.29     Document Type: Conference Paper

References (17)

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