Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy

Journal of Electron Microscopy

Volumn 53, Issue 3, 2004, Pages 245-255

  Ishitani, Tohru ^a   Sato, Mitsugu ^a  

^a HITACHI HIGH TECHNOLOGIES CORPORATION   (Japan)

Author keywords

Contrast; Image resolution; Scanning electron microscope

Indexed keywords

ALGORITHM; ARTICLE; IMAGE ENHANCEMENT; IMAGE PROCESSING; METHODOLOGY; SCANNING ELECTRON MICROSCOPY;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, SCANNING;

GRADIENT METHODS; IMAGE SEGMENTATION; SCANNING ELECTRON MICROSCOPY; SIGNAL TO NOISE RATIO;

CG METHODS; CONTRAST; GRADIENT'S METHODS; IMAGE NOISE; RANDOM IMAGE; RANDOM NOISE; REGION-OF-INTEREST; REGIONS OF INTEREST; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRONS;

IMAGE RESOLUTION;

EID: 3242878215     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/53.3.245     Document Type: Article

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