Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy

Journal of Electron Microscopy

Volumn 54, Issue 2, 2005, Pages 85-97

  Ishitani, Tohru ^a   Kamiya, Chisato ^a   Sato, Mitsugu ^a  

^a HITACHI HIGH TECHNOLOGIES CORPORATION   (Japan)

Author keywords

Contrast; Contrast to gradient; Image resolution; Scanning electron microscope

Indexed keywords

PERSONAL COMPUTERS; SCANNING ELECTRON MICROSCOPY;

CONTRAST; CONTRAST TO GRADIENT; GRADIENT IMAGES; GRADIENT'S METHODS; LOCAL SURFACES; PIXEL POSITION; R VALUE; RANDOM NOISE; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRONS;

IMAGE RESOLUTION;

EID: 23944486950     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/dfi003     Document Type: Article

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