Recent developments in nano-characterization of materials

Journal of Ceramic Processing Research

Volumn 5, Issue 1, 2004, Pages 5-9

  Sinclair, R ^a   Li, H ^a   Risner, J ^a   Kwon, U ^a   Huh, J U ^a   Chin, R W ^a   Min, K H ^a  

^a Stanford University   (United States)

Author keywords

Characterization; Electron microscopy; Focussed ion beam; Nano materials; Surface analysis

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ENERGY; FILTRATION; IMAGING; NANOPARTICLE; REVIEW; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 2542490302     PISSN: 12299162     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (4)

1. E.D. Boyes, Mikrochimica Acta 138 (2002) 225-234.
2. M. Lentzen, B. Jahnen, C.L. Jia, A. Thust, K. Tillmann, and K. Urban, Ultramicroscopy 92 (2002) 233-242.
3. J.E. Wittig, T.P. Nolan, C.A. Ross, M.E. Schabes, K. Tang, R. Sinclair, and J. Bentley, IEEE Trans. Magn. 34 (1998) 1564-1566.
4. Techniques and instruments discussed in this paper can be found from the following links: http://www.feicompany.com/eng/products/list.html http://www.jeol.com/products.html http://www.hitachihta.com/ (12tbp245kkh1et45kekt4kre)/ pageloader.aspx? type=product_finder&stype= technology&text=Electron%2 0Microscopes&id=5 http://www.cameca.fr/html/ analysis.html http://www.ulvac-phi.co.jp/english/index.htm