Resolution parameters for model functions used in surface analysis

Surface and Interface Analysis

Volumn 33, Issue 12, 2002, Pages 950-953

  Seah, Martin P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

AES; Auger electron spectroscopy; Gaussian; Lorentzian; Resolution; X ray photoelectron spectroscopy; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; FUNCTIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

RESOLUTION PARAMETERS;

SURFACE STRUCTURE;

EID: 0036905265     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1452     Document Type: Article

References (3)

1. Hatting E., Read F.H. Electrostatic Lenses. Elsevier: Amsterdam, 1976.
2. Cazaux J. Surf. Sci. 1983; 125: 335.
3. Seah M.P. In Practical Surface Analysis Vol. 1. Auger and X-ray Photoelectron Spectroscopy, Briggs D., Seah M.P. (eds). John Wiley: Chichester, 1990; 201.