SCOPUS 정보 검색 플랫폼

Journal of Vacuum Science and Technology B

Volumn 28, Issue 3, 2010, Pages

Application of the KolibriSensor to combined atomic-resolution scanning tunneling microscopy and noncontact atomic-force microscopy imaging

(3) Torbrügge, Stefan a Schaff, Oliver a Rychen, Jörg b

a SPECS SURFACE NANO ANALYSIS GMBH (Germany)

b SPECS Zurich GmbH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FEEDBACK;

ATOMIC-RESOLUTION; ATOMIC-RESOLUTION IMAGING; DYNAMIC SCANNING; FEEDBACK MODE; MICROSCOPY IMAGING; NONCONTACT ATOMIC FORCE MICROSCOPY; PIEZOELECTRIC; RESOLUTION SCANNING; SI(1 1 1)-7 × 7; SI(111)7×7;

SCANNING TUNNELING MICROSCOPY;

EID: 77953000530 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3430544 Document Type: Conference Paper

Times cited : (40)

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