Frequency noise in frequency modulation atomic force microscopy

Review of Scientific Instruments

Volumn 80, Issue 4, 2009, Pages

  Kobayashi, Kei ^a   Yamada, Hirofumi ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC-FORCE MICROSCOPIES; CANTILEVER DISPLACEMENTS; DETECTION METHODS; DISPLACEMENT SENSORS; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPIES; FREQUENCY NOISE; HIGH-RESOLUTION IMAGING; HYDRODYNAMIC INTERACTIONS; NOISE REDUCTIONS; Q FACTORS; SMALL AMPLITUDES;

ATOMS; FLUID DYNAMICS; FREQUENCY MODULATION; LIQUIDS; NANOCANTILEVERS; NUMERICAL CONTROL SYSTEMS; SENSORS;

ATOMIC FORCE MICROSCOPY;

EID: 65449172852     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3120913     Document Type: Article

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