Up close & personal with atoms & molecules

Materials Today

Volumn 12, Issue 7-8, 2009, Pages 18-25

  Lang, Hans Peter ^a   Gerber, Christoph ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; BOTTOM UP APPROACH; ENERGY CONSUMPTION; LANGUAGE BARRIERS; NANO-METER SCALE; NATURAL WORLD; NEW TECHNOLOGIES; SCANNING TUNNELING MICROSCOPES; SCIENCE DISCIPLINES; SELF-ASSEMBLY; SELF-ORGANISATION; TOP DOWN APPROACHES;

ATOMS; CURRICULA; MATERIALS HANDLING;

DATA HANDLING;

EID: 68349128294     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(09)70198-1     Document Type: Review

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