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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 3 B, 2006, Pages 1996-1999

Surface potential measurement by atomic force microscopy using quartz resonator

(2) Heike, Seiji a Hashizume, Tomihiro a

a HITACHI LTD (Japan)

Author keywords

Atomic force microscopy; Kelvin probe; Surface potential; Work function

Indexed keywords

ATOMIC FORCE MICROSCOPY; GOLD; PROBES; QUARTZ; SINGLE CRYSTALS; TUNGSTEN;

KELVIN PROBE; SURFACE POTENTIAL; WORK FUNCTION;

RESONATORS;

EID: 33645509766 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.45.1996 Document Type: Article

Times cited : (3)

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