Tip size effect on the appearance of a STM image for complex surfaces: Theory versus experiment for Si(111)-(7 X 7)

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 7, 2004, Pages

  Wang, Y L ^a   Gao, H J ^a   Guo, H M ^a   Liu, H W ^a   Batyrev, I G ^b   McMahon, W E ^b   Zhang, S B ^b  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; ATOM; DENSITY FUNCTIONAL THEORY; ELECTRIC POTENTIAL; ENERGY; GEOMETRY; MATHEMATICAL ANALYSIS; SCANNING TUNNELING MICROSCOPY;

EID: 19544376638     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.073312     Document Type: Article

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