Flat-field calibration of CCD detector for long trace profiler

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6704, Issue , 2007, Pages

  Kirschman, Jonathan L ^a   Domning, Edward E ^a   Franck, Keith D ^a   Irick, Steven C ^a   MacDowell, Alastair A ^a   McKinney, Wayne R ^a   Morrison, Gregory Y ^a   Smith, Brian V ^a   Warwick, Tony ^a   Yashchuk, Valeriy V ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Camera calibration; Error reduction; Flat field source; Long trace profiler; LTP; LTP detector; Optical metrology

Indexed keywords

DARK CURRENTS; FREE ELECTRON LASERS; OPTICAL SYSTEMS; PHOTODETECTORS; SYNCHROTRONS; X RAY OPTICS;

CAMERA CALIBRATION; ERROR REDUCTION; FLAT FIELD SOURCE; LONG TRACE PROFILER (LTP); OPTICAL METROLOGY;

CCD CAMERAS;

EID: 42149101657     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.732618     Document Type: Conference Paper

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