메뉴 건너뛰기




Volumn 7077, Issue , 2008, Pages

Distance-dependent influences on angle metrology with autocollimators in deflectometry

Author keywords

Angle; Angle calibration; Autocollimator; Deflectometry; Flatness standard; Precision metrology; Traceability

Indexed keywords

ANGLE MEASUREMENT; CALIBRATION; COMPARATORS (OPTICAL); LIGHT; MEASUREMENTS; PRINTED CIRCUIT BOARDS; SURFACES;

EID: 56249136540     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.793742     Document Type: Conference Paper
Times cited : (40)

References (28)
  • 1
    • 31844438542 scopus 로고    scopus 로고
    • The Nanometer Optical Component Measuring Machine - NOM - at BESSY
    • BESSY, Berlin
    • H. Lammert, T. Noll, T. Schlegel, F. Siewert, and T. Zeschke, 'The Nanometer Optical Component Measuring Machine - NOM - at BESSY', BESSY Annual Report 2002, 399-402 (BESSY, Berlin, 2002; www.bessy.de)
    • (2002) BESSY Annual Report 2002 , pp. 399-402
    • Lammert, H.1    Noll, T.2    Schlegel, T.3    Siewert, F.4    Zeschke, T.5
  • 2
    • 31844434573 scopus 로고    scopus 로고
    • Breakthrough in the metrology and manufacture of op tical components for synchrotron radiation
    • BESSY, Berlin
    • H. Lammert, T. Noll, T. Schlegel, F. Senf, F. Siewert, and T. Zeschke, 'Breakthrough in the metrology and manufacture of op tical components for synchrotron radiation', BESSY Annual Report 2003, 530-533 (BESSY, Berlin 2003; www.bessy.de)
    • (2003) BESSY Annual Report 2003 , pp. 530-533
    • Lammert, H.1    Noll, T.2    Schlegel, T.3    Senf, F.4    Siewert, F.5    Zeschke, T.6
  • 3
    • 77950850815 scopus 로고    scopus 로고
    • The Nanometer Optical Component Measuring Machine: A new sub-nm topography measuring device for X-ray optics at BESSY
    • F. Siewert, T. Noll, T. Schlegel, T. Zeschke, and H. Lammert, 'The Nanometer Optical Component Measuring Machine: A new sub-nm topography measuring device for X-ray optics at BESSY', AIP Conf. Proc. 705 (2004), 847-850
    • (2004) AIP Conf. Proc , vol.705 , pp. 847-850
    • Siewert, F.1    Noll, T.2    Schlegel, T.3    Zeschke, T.4    Lammert, H.5
  • 5
    • 33947360622 scopus 로고    scopus 로고
    • Surface deformations of optical elements - an investigation of optical systems using the BESSY-NOM
    • T. Zeschke, R. Follath, H. Lammert and F. Senf, 'Surface deformations of optical elements - an investigation of optical systems using the BESSY-NOM', AIP Conf. Proc. 879 (2007), 679-682
    • (2007) AIP Conf. Proc , vol.879 , pp. 679-682
    • Zeschke, T.1    Follath, R.2    Lammert, H.3    Senf, F.4
  • 7
    • 0000133858 scopus 로고    scopus 로고
    • Solution to the shearing problem
    • C. Elster and I. Weingärtner, 'Solution to the shearing problem', Appl. Optics 38(23) (1999), 5024-5031
    • (1999) Appl. Optics , vol.38 , Issue.23 , pp. 5024-5031
    • Elster, C.1    Weingärtner, I.2
  • 8
    • 0033343741 scopus 로고    scopus 로고
    • Novel scanning technique for ultra-precise measurement of topography
    • I. Weingärtner, M. Schulz, and C. Elster, 'Novel scanning technique for ultra-precise measurement of topography', Proc. SPIE 3782 (1999), 306-317
    • (1999) Proc. SPIE , vol.3782 , pp. 306-317
    • Weingärtner, I.1    Schulz, M.2    Elster, C.3
  • 9
    • 0035760597 scopus 로고    scopus 로고
    • Use and traceable calibration of autocollimators for ultra-precise measurement of slope and topography
    • R.D. Geckeler, I. Weingärtner, A. Just, and R. Probst, 'Use and traceable calibration of autocollimators for ultra-precise measurement of slope and topography', Proc. SPIE 4401 (2001), 184-195
    • (2001) Proc. SPIE , vol.4401 , pp. 184-195
    • Geckeler, R.D.1    Weingärtner, I.2    Just, A.3    Probst, R.4
  • 10
    • 0036987049 scopus 로고    scopus 로고
    • Sub-nm topography measurement of large flats: An ultra-precise flatness standard for semiconductor industry
    • R.D. Geckeler and I. Weingärtner, 'Sub-nm topography measurement of large flats: An ultra-precise flatness standard for semiconductor industry', Proc. SPIE 4779 (2002), 1-12
    • (2002) Proc. SPIE , vol.4779 , pp. 1-12
    • Geckeler, R.D.1    Weingärtner, I.2
  • 11
    • 0042417221 scopus 로고    scopus 로고
    • Sub-nm-Topographiemessung mit hochgenauen Autokollimatoren
    • in German
    • R.D. Geckeler, A. Just, R. Probst, and I. Weingärtner, 'Sub-nm-Topographiemessung mit hochgenauen Autokollimatoren', Technisches Messen 69 (2002), 535-541 (in German)
    • (2002) Technisches Messen , vol.69 , pp. 535-541
    • Geckeler, R.D.1    Just, A.2    Probst, R.3    Weingärtner, I.4
  • 12
    • 33750021697 scopus 로고    scopus 로고
    • R.D. Geckeler, 'Error minimization in high-accuracy scanning deflectometry', Proc. SPIE 6293 (2006), 62930O, 12 p.
    • R.D. Geckeler, 'Error minimization in high-accuracy scanning deflectometry', Proc. SPIE 6293 (2006), 62930O, 12 p.
  • 13
    • 33947641628 scopus 로고    scopus 로고
    • Optimal use of pentaprisms in highly accurate deflectometric scanning
    • R.D. Geckeler, 'Optimal use of pentaprisms in highly accurate deflectometric scanning', Meas. Sci. Technol. 18(1) (2007), 115-125
    • (2007) Meas. Sci. Technol , vol.18 , Issue.1 , pp. 115-125
    • Geckeler, R.D.1
  • 14
    • 42149156225 scopus 로고    scopus 로고
    • R.D. Geckeler and A. Just, 'Optimized use and calibration of autocollimators in deflectometry', Proc. SPIE 6704 (2007), 670407, 12 p.
    • R.D. Geckeler and A. Just, 'Optimized use and calibration of autocollimators in deflectometry', Proc. SPIE 6704 (2007), 670407, 12 p.
  • 15
    • 56249142564 scopus 로고    scopus 로고
    • Elcomat 3000, Möller Wedel Optical, http://www.moeller-wedel- optical.com
    • Elcomat 3000, Möller Wedel Optical, http://www.moeller-wedel- optical.com
  • 17
    • 42149119162 scopus 로고    scopus 로고
    • V.V. Yashchuk, W. McKinney, T. Warwick, T. Noll, F. Siewert, T. Zeschke, R.D. Geckeler, 'Proposal for a universal test mir ror for characterization of slope measuring instruments', Proc. SPIE 6704 (2007), 67040A, 12 p.
    • V.V. Yashchuk, W. McKinney, T. Warwick, T. Noll, F. Siewert, T. Zeschke, R.D. Geckeler, 'Proposal for a universal test mir ror for characterization of slope measuring instruments', Proc. SPIE 6704 (2007), 67040A, 12 p.
  • 18
    • 0242304816 scopus 로고    scopus 로고
    • Calibration of high-resolution electronic autocollimators against an ang le comparator
    • A. Just, M. Krause, R. Probst, and R. Wittekopf, 'Calibration of high-resolution electronic autocollimators against an ang le comparator', Metrologia 40 (2003), 288-294
    • (2003) Metrologia , vol.40 , pp. 288-294
    • Just, A.1    Krause, M.2    Probst, R.3    Wittekopf, R.4
  • 20
    • 0005373594 scopus 로고
    • Angle standards and their calibration
    • ed. P.L. Hewitt, World Scientific, Singapore
    • P.J. Sim, 'Angle standards and their calibration', in Modern Techniques in Metrology, ed. P.L. Hewitt, 102-121 (World Scientific, Singapore, 1984)
    • (1984) Modern Techniques in Metrology , pp. 102-121
    • Sim, P.J.1
  • 21
    • 56249115364 scopus 로고    scopus 로고
    • European Patent 0 440 833 B 1 1994, patentee: Dr. Johannes Heidenhain GmbH
    • A. Ernst, European Patent 0 440 833 B 1 (1994), patentee: Dr. Johannes Heidenhain GmbH
    • Ernst, A.1
  • 22
    • 0141842489 scopus 로고    scopus 로고
    • Six nanoradian in 2∏ radian - A primary standard for angle measurement
    • R. Probst, M. Krause, 'Six nanoradian in 2∏ radian - A primary standard for angle measurement', Proc. 2nd euspen (2001), 326-329
    • (2001) Proc. 2nd euspen , pp. 326-329
    • Probst, R.1    Krause, M.2
  • 23
    • 33749005944 scopus 로고    scopus 로고
    • Calibration of angle encoders using transfer functions
    • R.D. Geckeler, A. Fricke, and C. Elster, 'Calibration of angle encoders using transfer functions', Meas. Sci. Technol. 17(10) (2006), 2811-2818
    • (2006) Meas. Sci. Technol , vol.17 , Issue.10 , pp. 2811-2818
    • Geckeler, R.D.1    Fricke, A.2    Elster, C.3
  • 24
    • 0024647605 scopus 로고    scopus 로고
    • T. Masuda T and M. Kajitani, 'An automatic calibration system for angular encoders', Precis. Eng. 11 (1989), 95-100
    • T. Masuda T and M. Kajitani, 'An automatic calibration system for angular encoders', Precis. Eng. 11 (1989), 95-100
  • 26
    • 56249132281 scopus 로고    scopus 로고
    • first proposed by I. Weingärtner, 2002, priv. comm.
    • first proposed by I. Weingärtner, 2002, priv. comm.
  • 27
    • 34250009147 scopus 로고
    • The refractive index of air
    • B. Edlén, 'The refractive index of air', Metrologia 2 (1966), 71-80
    • (1966) Metrologia , vol.2 , pp. 71-80
    • Edlén, B.1
  • 28
    • 0027659135 scopus 로고
    • An updated Edlén equation for the refractive index of air
    • K.P. Birch and M.J. Downs, 'An updated Edlén equation for the refractive index of air', Metrologia 30 (1993), 155-162
    • (1993) Metrologia , vol.30 , pp. 155-162
    • Birch, K.P.1    Downs, M.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.