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1
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31844438542
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The Nanometer Optical Component Measuring Machine - NOM - at BESSY
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BESSY, Berlin
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H. Lammert, T. Noll, T. Schlegel, F. Siewert, and T. Zeschke, 'The Nanometer Optical Component Measuring Machine - NOM - at BESSY', BESSY Annual Report 2002, 399-402 (BESSY, Berlin, 2002; www.bessy.de)
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(2002)
BESSY Annual Report 2002
, pp. 399-402
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Lammert, H.1
Noll, T.2
Schlegel, T.3
Siewert, F.4
Zeschke, T.5
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2
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31844434573
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Breakthrough in the metrology and manufacture of op tical components for synchrotron radiation
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BESSY, Berlin
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H. Lammert, T. Noll, T. Schlegel, F. Senf, F. Siewert, and T. Zeschke, 'Breakthrough in the metrology and manufacture of op tical components for synchrotron radiation', BESSY Annual Report 2003, 530-533 (BESSY, Berlin 2003; www.bessy.de)
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(2003)
BESSY Annual Report 2003
, pp. 530-533
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Lammert, H.1
Noll, T.2
Schlegel, T.3
Senf, F.4
Siewert, F.5
Zeschke, T.6
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3
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77950850815
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The Nanometer Optical Component Measuring Machine: A new sub-nm topography measuring device for X-ray optics at BESSY
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F. Siewert, T. Noll, T. Schlegel, T. Zeschke, and H. Lammert, 'The Nanometer Optical Component Measuring Machine: A new sub-nm topography measuring device for X-ray optics at BESSY', AIP Conf. Proc. 705 (2004), 847-850
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(2004)
AIP Conf. Proc
, vol.705
, pp. 847-850
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Siewert, F.1
Noll, T.2
Schlegel, T.3
Zeschke, T.4
Lammert, H.5
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4
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31844453293
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Advanced metrology, an essential support for the surface finishing of high performance x-ray optics
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F. Siewert, H. Lammert, T. Noll, T. Schlegel, T. Zeschke, T. Hänsel, A. Nickel, A. Schindler, B. Grubert, and C. Schlewitt, 'Advanced metrology, an essential support for the surface finishing of high performance x-ray optics', Proc. SPIE 5921 (2005), 1-11
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(2005)
Proc. SPIE
, vol.5921
, pp. 1-11
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Siewert, F.1
Lammert, H.2
Noll, T.3
Schlegel, T.4
Zeschke, T.5
Hänsel, T.6
Nickel, A.7
Schindler, A.8
Grubert, B.9
Schlewitt, C.10
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5
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33947360622
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Surface deformations of optical elements - an investigation of optical systems using the BESSY-NOM
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T. Zeschke, R. Follath, H. Lammert and F. Senf, 'Surface deformations of optical elements - an investigation of optical systems using the BESSY-NOM', AIP Conf. Proc. 879 (2007), 679-682
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(2007)
AIP Conf. Proc
, vol.879
, pp. 679-682
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Zeschke, T.1
Follath, R.2
Lammert, H.3
Senf, F.4
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6
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33947355007
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Inspection of a spherical triple VLS-grating for selfseeding of FLASH at DESY
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F. Siewert, H. Lammert, G. Reichardt, U. Hahn, R. Treusch, R. Reininger, 'Inspection of a spherical triple VLS-grating for selfseeding of FLASH at DESY', AIP Conf. Proc. 879 (2007), 667-670
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(2007)
AIP Conf. Proc
, vol.879
, pp. 667-670
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Siewert, F.1
Lammert, H.2
Reichardt, G.3
Hahn, U.4
Treusch, R.5
Reininger, R.6
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7
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0000133858
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Solution to the shearing problem
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C. Elster and I. Weingärtner, 'Solution to the shearing problem', Appl. Optics 38(23) (1999), 5024-5031
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(1999)
Appl. Optics
, vol.38
, Issue.23
, pp. 5024-5031
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Elster, C.1
Weingärtner, I.2
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8
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0033343741
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Novel scanning technique for ultra-precise measurement of topography
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I. Weingärtner, M. Schulz, and C. Elster, 'Novel scanning technique for ultra-precise measurement of topography', Proc. SPIE 3782 (1999), 306-317
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(1999)
Proc. SPIE
, vol.3782
, pp. 306-317
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Weingärtner, I.1
Schulz, M.2
Elster, C.3
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9
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0035760597
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Use and traceable calibration of autocollimators for ultra-precise measurement of slope and topography
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R.D. Geckeler, I. Weingärtner, A. Just, and R. Probst, 'Use and traceable calibration of autocollimators for ultra-precise measurement of slope and topography', Proc. SPIE 4401 (2001), 184-195
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(2001)
Proc. SPIE
, vol.4401
, pp. 184-195
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Geckeler, R.D.1
Weingärtner, I.2
Just, A.3
Probst, R.4
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10
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0036987049
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Sub-nm topography measurement of large flats: An ultra-precise flatness standard for semiconductor industry
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R.D. Geckeler and I. Weingärtner, 'Sub-nm topography measurement of large flats: An ultra-precise flatness standard for semiconductor industry', Proc. SPIE 4779 (2002), 1-12
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(2002)
Proc. SPIE
, vol.4779
, pp. 1-12
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Geckeler, R.D.1
Weingärtner, I.2
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11
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0042417221
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Sub-nm-Topographiemessung mit hochgenauen Autokollimatoren
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in German
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R.D. Geckeler, A. Just, R. Probst, and I. Weingärtner, 'Sub-nm-Topographiemessung mit hochgenauen Autokollimatoren', Technisches Messen 69 (2002), 535-541 (in German)
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(2002)
Technisches Messen
, vol.69
, pp. 535-541
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Geckeler, R.D.1
Just, A.2
Probst, R.3
Weingärtner, I.4
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12
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33750021697
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R.D. Geckeler, 'Error minimization in high-accuracy scanning deflectometry', Proc. SPIE 6293 (2006), 62930O, 12 p.
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R.D. Geckeler, 'Error minimization in high-accuracy scanning deflectometry', Proc. SPIE 6293 (2006), 62930O, 12 p.
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13
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33947641628
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Optimal use of pentaprisms in highly accurate deflectometric scanning
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R.D. Geckeler, 'Optimal use of pentaprisms in highly accurate deflectometric scanning', Meas. Sci. Technol. 18(1) (2007), 115-125
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(2007)
Meas. Sci. Technol
, vol.18
, Issue.1
, pp. 115-125
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Geckeler, R.D.1
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14
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42149156225
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R.D. Geckeler and A. Just, 'Optimized use and calibration of autocollimators in deflectometry', Proc. SPIE 6704 (2007), 670407, 12 p.
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R.D. Geckeler and A. Just, 'Optimized use and calibration of autocollimators in deflectometry', Proc. SPIE 6704 (2007), 670407, 12 p.
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15
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56249142564
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Elcomat 3000, Möller Wedel Optical, http://www.moeller-wedel- optical.com
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Elcomat 3000, Möller Wedel Optical, http://www.moeller-wedel- optical.com
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16
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56249119348
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Autocollimator based slope measuring profiler (a la BESSY NOM) under development at the ALS OML
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Berkeley, USA, June 26
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V.V. Yashchuk, J.L. Kirschman, G.Y. Morrison, B.V. Smith, E.E. Domning, F. Siewert, T. Zeschke, R.D. Geckeler, A. Just, 'Autocollimator based slope measuring profiler (a la BESSY NOM) under development at the ALS OML', talk at the Experimental Systems Group Weekly Speaker Meeting, Advanced Light Source, Berkeley, USA, June 26, 2008
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(2008)
talk at the Experimental Systems Group Weekly Speaker Meeting, Advanced Light Source
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Yashchuk, V.V.1
Kirschman, J.L.2
Morrison, G.Y.3
Smith, B.V.4
Domning, E.E.5
Siewert, F.6
Zeschke, T.7
Geckeler, R.D.8
Just, A.9
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17
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42149119162
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V.V. Yashchuk, W. McKinney, T. Warwick, T. Noll, F. Siewert, T. Zeschke, R.D. Geckeler, 'Proposal for a universal test mir ror for characterization of slope measuring instruments', Proc. SPIE 6704 (2007), 67040A, 12 p.
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V.V. Yashchuk, W. McKinney, T. Warwick, T. Noll, F. Siewert, T. Zeschke, R.D. Geckeler, 'Proposal for a universal test mir ror for characterization of slope measuring instruments', Proc. SPIE 6704 (2007), 67040A, 12 p.
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18
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0242304816
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Calibration of high-resolution electronic autocollimators against an ang le comparator
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A. Just, M. Krause, R. Probst, and R. Wittekopf, 'Calibration of high-resolution electronic autocollimators against an ang le comparator', Metrologia 40 (2003), 288-294
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(2003)
Metrologia
, vol.40
, pp. 288-294
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Just, A.1
Krause, M.2
Probst, R.3
Wittekopf, R.4
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19
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0032115106
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The new PTB angle comparator
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R. Probst, R. Wittekopf, M. Krause, H. Dangschat, and A. Ernst, 'The new PTB angle comparator', Meas. Sci. Technol. 9 (1998), 1059-1066
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(1998)
Meas. Sci. Technol
, vol.9
, pp. 1059-1066
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Probst, R.1
Wittekopf, R.2
Krause, M.3
Dangschat, H.4
Ernst, A.5
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20
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0005373594
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Angle standards and their calibration
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ed. P.L. Hewitt, World Scientific, Singapore
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P.J. Sim, 'Angle standards and their calibration', in Modern Techniques in Metrology, ed. P.L. Hewitt, 102-121 (World Scientific, Singapore, 1984)
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(1984)
Modern Techniques in Metrology
, pp. 102-121
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Sim, P.J.1
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21
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56249115364
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European Patent 0 440 833 B 1 1994, patentee: Dr. Johannes Heidenhain GmbH
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A. Ernst, European Patent 0 440 833 B 1 (1994), patentee: Dr. Johannes Heidenhain GmbH
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Ernst, A.1
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22
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0141842489
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Six nanoradian in 2∏ radian - A primary standard for angle measurement
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R. Probst, M. Krause, 'Six nanoradian in 2∏ radian - A primary standard for angle measurement', Proc. 2nd euspen (2001), 326-329
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(2001)
Proc. 2nd euspen
, pp. 326-329
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Probst, R.1
Krause, M.2
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23
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33749005944
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Calibration of angle encoders using transfer functions
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R.D. Geckeler, A. Fricke, and C. Elster, 'Calibration of angle encoders using transfer functions', Meas. Sci. Technol. 17(10) (2006), 2811-2818
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(2006)
Meas. Sci. Technol
, vol.17
, Issue.10
, pp. 2811-2818
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Geckeler, R.D.1
Fricke, A.2
Elster, C.3
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24
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0024647605
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T. Masuda T and M. Kajitani, 'An automatic calibration system for angular encoders', Precis. Eng. 11 (1989), 95-100
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T. Masuda T and M. Kajitani, 'An automatic calibration system for angular encoders', Precis. Eng. 11 (1989), 95-100
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26
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56249132281
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first proposed by I. Weingärtner, 2002, priv. comm.
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first proposed by I. Weingärtner, 2002, priv. comm.
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27
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34250009147
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The refractive index of air
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B. Edlén, 'The refractive index of air', Metrologia 2 (1966), 71-80
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(1966)
Metrologia
, vol.2
, pp. 71-80
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Edlén, B.1
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28
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0027659135
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An updated Edlén equation for the refractive index of air
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K.P. Birch and M.J. Downs, 'An updated Edlén equation for the refractive index of air', Metrologia 30 (1993), 155-162
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(1993)
Metrologia
, vol.30
, pp. 155-162
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Birch, K.P.1
Downs, M.J.2
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