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Volumn 6293, Issue , 2006, Pages

Error minimization in high-accuracy scanning deflectometry

Author keywords

Autocollimator; Deflectometry; Dimensional metrology; Flatness standard; Traceability; Transfer function

Indexed keywords

AUTOCOLLIMATORS; DEFLECTOMETRY; DIMENSIONAL METROLOGY; FLATNESS STANDARD; TRACEABILITY; TRANSFER FUNCTION;

EID: 33750021697     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.679339     Document Type: Conference Paper
Times cited : (27)

References (24)
  • 6
    • 0041332371 scopus 로고    scopus 로고
    • eds. P. Ciarlini, M.G. Cox, E. Filipe, F. Pavese, D. Richter, (Singapore: World Scientific)
    • M.G. Cox et al., in: Advanced Mathematical and Computational Tools in Metrology V, eds. P. Ciarlini, M.G. Cox, E. Filipe, F. Pavese, D. Richter, (Singapore: World Scientific), 2001, pp 93-105
    • (2001) Advanced Mathematical and Computational Tools in Metrology V , pp. 93-105
    • Cox, M.G.1
  • 15
    • 33749985336 scopus 로고    scopus 로고
    • Berlin: BESSY
    • H. Lammert et al., BESSY Ann. Report 2003, (Berlin: BESSY), 2004, www.bessy.de, pp 530-533
    • (2004) BESSY Ann. Report 2003 , pp. 530-533
    • Lammert, H.1
  • 16
    • 33750021556 scopus 로고    scopus 로고
    • in print
    • F. Siewert et al., Proc SPIE 5921 (2005), in print
    • (2005) Proc SPIE , vol.5921
    • Siewert, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.