Quantitative Z-contrast atomic resolution studies of semiconductor nanostructured materials

Journal of Physics: Conference Series

Volumn 209, Issue , 2010, Pages

  Carlino, E ^a  

^a LABORATORIO TASC   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ANGSTROM RESOLUTION; ATOMIC RESOLUTION; HIGH-ANGLE ANNULAR DARK FIELDS; IMAGE INTENSITIES; INTENSITY DISTRIBUTION; MATERIAL SYSTEMS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR NANOSTRUCTURED MATERIALS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77950471086     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/209/1/012005     Document Type: Conference Paper

References (46)

1. Nellist P D, Chisholm M F, Dellby N, Krivanek O L, Murfitt M F, Szilagyi Z S, Lupini A R, Borisevich A, Sides W H jr and Pennycook S J 2004 Science 305 1741
2. Pennycook S J 2002 Advances in imaging and Electron Physics vol 123 (Academic Press New York) p 140
3. Spence J C H 1988 Experimental High-resolution electron microscopy 2nd ed. (Oxford University Press)
4. Yan Y F, Al-Jassim M M, Chisholm M F, Boatner L A, Pennycook S J and Oxley M 2005 Phys. Rev. B 71 041309
5. Colli A, Carlino E, Pelucchi E, Grillo V and Franciosi A 2004 J. Appl. Phys. 96 2592
6. Rafferty B and Pennycook S J 1999 Ultramic. 78 141
7. Pennycook S J and Jesson D E 1990 Phys. Rev. Lett. 64 938
8. Carlino E, Modesti S, Furlanetto D, Piccin M, Rubini S and Franciosi A 2003 Appl. Phys. Lett. 83 662
9. Voyles P M, Muller D A, Grazul J L, Citrin P H and Gossmann H-J L 2002 Nature 416 826
10. Anderson S C, Birkeland C R, Anstis G R and Cockayne D J H 1997 Ultramic. 69 83
11. Liu C P, Preston A R, Boothroyd B and Humphreys C J 1999 J. Microsc. 194 171
12. Rubini S et al 2006 Appl. Phys. Lett. 88 141923
13. James E M and Browning N D 1999 Ultramic. 78 125
14. Carlino E, Grillo V 2005 Proceedings MCEM VII ISBN 961-6303-69-4 159
15. Pennycook S J and Nellist P D 1999 Impact of Electron Microscopy on Materials Research (Kluwer Academic Publisher) p 161
16. Treacy M M J, Howie A and Pennycook S J 1980 Inst. Phys. Conf. Ser. vol 52 p 261
17. Kittel C 1986 Introduction to Solid State Physics 6th edn (J. Wiley & Sons, Inc, New York) p 602
18. Rafferty B, Nellist P D and Pennycook S J 2001 J. Electron. Mic. 50 227
19. Carlino E, Grillo V 2005 Phys. Rev. B 71 235303
20. Grillo V, Carlino E and Glas F 2008 Phys. Rev. B 77 054103
21. Metherell A J F 1976 Diffraction of Electrons by Perfect Crystals Electron Microscopy in Materials Science ed U Valdre' and E Ruedl (EUR 5515e Brussels and Luxemburg)
22. Goodman P, Moodie A F 1974 Acta Cryst. A 30 280
23. Muller D A, Edwards B, Kirkland E J and Silcox J 2001 Ultramic. 86 371
24. Pennycook S J and Jesson D E 1991 Ultramic. 37 14
25. Allen L J, Rossouw C J 1993 Phys. Rev. B 47 2446
26. Watanabe K, Yamazaki T, Hashimoto I, Shiojiri M 2001 Phys. Rev. B 64 115432
27. Wang Z L 1999 Phil. Mag. B 79 37
28. Ishizuka K 2002 Ultramic. 90 71
29. Dinges C, Berger A, Rose H 1995 Ultramic. 60 49
30. Kirkland E J 1998 Advanced Computing in electron microscope (Plenum Press, New York)
31. Croitoru M D, Van Dyck D, Van Aert S, Bals S, Verbeeck J 2006 Ultramic. 106 933
32. Xu P, Loane R F, Silcox J 1991 Ultramic. 38 127
33. Carlino E, Grillo V and Palazzari P 2007 Microscopy of Semiconducting Materials Cambridge 2007 Springer Proc. in Phys. vol 120 ed Cullis A and Midgley P (Springer Netherlands) p 177
34. Yu P Y and Cardona M 1996 Fundamentals of Semiconductors (Springer-Verlag Berlin Heidelberg New York) p 182
35. Grillo V and Carlino E 2006 Ultramic. 106 603
36. Klenov D O and Stammer S 2006 Ultramic. 106 889
37. Yu Z, Batson P E and Silcox J 2003 Ultramic. 96 275
38. Glas F 1995 Phys. Rev. B 51 825
39. Keating P N 1966 Phys. Rev. B 145 637
40. Martin R M 1970 Phys. Rev. B 1 4005
41. Podgorny M, Czyzyk P M, Balzarotti A, Letardi P, Kisiel A and Zimnal-Starnawska M 1985 Solid State Commun. 55 413
42. Rosenauer A, Schowalter M, Glas F and Lamoen D 2005 Phys. Rev. B 72 085326
43. Glas F 2004 Phil. Mag. 84 2055
44. Petkov V and Billinge S J L 2001 Physica B 305 83
45. Walther T and Humphreys C J 1997 Inst. Phys. Conf. Ser. vol 153 p 303
46. Grillo V and Carlino E 2007 Microscopy of Semiconducting Materials Springer Proc. in Phys. vol 120 ed Cullis A and Midgley P (Springer Netherlands) p 173