Atomic resolution composition analysis by scanning transmission electron microscopy high-angle annular dark-field imaging

Applied Physics Letters

Volumn 83, Issue 4, 2003, Pages 662-664

  Carlino, E ^a   Modesti, S ^a,b   Furlanetto, D ^a   Piccin, M ^a,b   Rubini, S ^a   Franciosi, A ^a,b  

^a LABORATORIO TASC   (Italy)

^b UNIVERSITY OF TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; IMAGING TECHNIQUES; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION;

SUPERLATTICES;

EID: 0043014839     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1592314     Document Type: Article

References (21)

1. P. E. Batson, N. Dellby, and O. L. Krivanek, Nature (London) 418, 617 (2002).
2. S. J. Pennycook and P. D. Nellist, Impact of Electron Microscopy on Materials Research (Kluwer Academic, Dordrecht, 1999), p. 161.
3. S. J. Pennycook and D. E. Jesson, Phys. Rev. Lett. 64, 938 (1990).
4. P. D. Nellist and S. J. Pennycook, Ultramicroscopy 78, 111 (1999).
5. K. Watanabe, T. Yamazaki, Y. Kikuchi, Y. Kotaka, M. Kawasaki, I. Hashimoto, and M. Shiojiri, Phys. Rev. B 63, 085316 (2001).
6. S. C. Anderson, C. R. Birkeland, G. R. Anstis, and D. J. H. Cockayne, Ultramicroscopy 69, 83 (1997).
7. M. J. Ashwin, M. Fahy, J. J. Harris, R. C. Newman, D. A. Sansom, R. Addinall, D. S. McPhail, and V. K. M. Sharma, J. Appl. Phys. 73, 633 (1993).
8. J. Wagner, R. C. Newman, and C. Roberts, J. Appl. Phys. 78, 2431 (1995); R. C. Newman, M. J. Aswin, M. R. Fahy, L. Hart, S. N. Holmes, C. Roberts, X. Zhang, and J. Wagner, Phys. Rev. B 54, 8769 (1996).
9. J. Wagner, R. C. Newman, and C. Roberts, J. Appl. Phys. 78, 2431 (1995); R. C. Newman, M. J. Aswin, M. R. Fahy, L. Hart, S. N. Holmes, C. Roberts, X. Zhang, and J. Wagner, Phys. Rev. B 54, 8769 (1996).
10. G. Scamarcio, V. Spagnolo, E. Molinari, L. Tapfer, L. Sorba, G. Bratina, and A. Franciosi, Phys. Rev. B 46, 7296 (1992); V. Spagnolo, G. Scamarcio, R. Colombelli, J.-M. Jancu, F. Beltram, L. Sorba, B. Müller, and A. Franciosi, ibid. 57, R15100 (1998).
11. G. Scamarcio, V. Spagnolo, E. Molinari, L. Tapfer, L. Sorba, G. Bratina, and A. Franciosi, Phys. Rev. B 46, 7296 (1992); V. Spagnolo, G. Scamarcio, R. Colombelli, J.-M. Jancu, F. Beltram, L. Sorba, B. Müller, and A. Franciosi, ibid. 57, R15100 (1998).
12. J. C. H. Spence, Experimental High-Resolution Electron Microscopy, 2nd ed. (Oxford University Press, Oxford, 1988), p. 87.
13. E. M. James and N. D. Browning, Ultramicroscopy 78, 125 (1999).
14. M. M. J. Treacy, A. Howie, and S. J. Pennycook, Inst. Phys. Conf. Ser. 52, 261 (1980).
15. D. D. Perovic, C. J. Rossouw, and A. Howie, Ultramicroscopy 52, 353 (1993).
16. P. D. Nellist and S. J. Pennycook, J. Microsc. 190, 159 (1998).
17. S. J. Pennycook, Advances in Imaging and Electron Physics (Academic, New York, 2002), Vol. 123, p. 140.
18. C. Kittel, Introduction to Solid State Physics, 7th ed, (Wiley, New York, 1996).
19. B. F. Buxton, S. J. Loveluck, and J. W. Steeds, Philos. Mag. 38, 259 (1978).
20. S. Modesti, D. Furlanetto, M. Piccin, S. Rubini, and A. Franciosi, Appl. Phys. Lett. 82, 1932 (2003).
21. S. Modesti, R. Duca, P. Finetti, G. Ceballos, M. Piccin, S. Rubini, and A. Franciosi (unpublished).