Phonon scattering: How does it affect the image contrast in high-resolution transmission electron microscopy?

Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

Volumn 79, Issue 1, 1999, Pages 37-48

  Wang, Z L ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ABSORPTION; ELECTRON SCATTERING; HIGH RESOLUTION ELECTRON MICROSCOPY; PHONONS; SILICON; THERMAL DIFFUSION IN SOLIDS;

PHONON SCATTERING; THERMAL DIFFUSE SCATTERING (TDS);

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032785756     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642819908206780     Document Type: Article

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