Characterization of self-assembled organic films using differential charging in X-ray photoelectron spectroscopy

Langmuir

Volumn 22, Issue 10, 2006, Pages 4649-4653

  Dubey, Manish ^a   Gouzman, Irina ^b   Bernasek, Steven L ^a   Schwartz, Jeffrey ^a  

^a PRINCETON UNIVERSITY   (United States)

^b SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL CHARGING; ELECTRON LOSS; SPECTRUM ACQUISITION; STRAY ELECTRONS;

CARBON; CONDUCTIVE MATERIALS; ELECTRONS; PHOSPHORUS COMPOUNDS; SELF ASSEMBLY; STAINLESS STEEL; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN FILMS;

GLASS; ORGANIC COMPOUND; OXIDE; PHOSPHONIC ACID DERIVATIVE; SILICON; STAINLESS STEEL;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; ELECTRON; SPECTROSCOPY; SURFACE PROPERTY; X RAY;

ELECTRIC CONDUCTIVITY; ELECTRONS; GLASS; ORGANIC CHEMICALS; OXIDES; PHOSPHONIC ACIDS; SILICON; SPECTRUM ANALYSIS; STAINLESS STEEL; SURFACE PROPERTIES; X-RAYS;

EID: 33744809253     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la053445f     Document Type: Article

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