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Journal of Applied Physics

Volumn 97, Issue 11, 2005, Pages

E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

(4) Cohen, H a Nogues, C a Zon, I a Lubomirsky, I a

a WEIZMANN INSTITUTE OF SCIENCE (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

E-BEAM-REFERENCED; LOW-ENERGY ELECTRONS; WORK-FUNCTION; X-RAY PHOTOELECTRON SPECTROMETERS;

COATING TECHNIQUES; CRYSTALS; ELECTRIC POTENTIAL; IRRADIATION; LIGHT; PARAMETER ESTIMATION; PERMITTIVITY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 20544441457 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1900296 Document Type: Article

Times cited : (34)

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