Submolecular potential profiling across organic monolayers

Nano Letters

Volumn 6, Issue 12, 2006, Pages 2848-2851

  Filip Granit, Neta ^a   Van Der Boom, Milko E ^a   Yerushalmi, Roie ^b   Scherz, Avigdor ^a   Cohen, Hagai ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACE POTENTIAL; ORGANIC MONOLAYERS; SUBMOLECULAR PROFILING;

MOLECULAR DYNAMICS; ORGANIC COMPOUNDS; PHOTOELECTRON SPECTROSCOPY;

MONOLAYERS;

EID: 33846393216     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0620435     Document Type: Article

References (26)

1. Netzer, L.; Sagiv, J. J. Am. Chem. Soc. 1983, 105, 674-676.
2. Ulman, A. An Introduction to Ultrathin Organic Films from Langmuir-Blodgett to Self-Assembly, Academic Press: Boston, MA, 1991.
3. Aviram, A.; Ratner, M. A. Chem. Phys. Lett. 1974, 29, 277-283.
4. Chen, J.; Reed, M. A.; Rawlett, A. M.; Tour, J. M. Science 1999, 286, 1550-1552.
5. Cui, X. D.; Primak, A.; Zarate, X.; Tomfohr, J.; Sankey, O. F.; Moore, A. L.; Moore, T. A.; Gust, D.; Harris, G.; Lindsay, S. M. Science 2001, 294, 571-574.
6. Liang, W. J.; Bockrath, M.; Park, H. Phys. Rev. Lett. 2002, 88, 126801/1-126801/4.
7. Dadosh, T.; Gordin, Y.; Krahne, R.; Khivrich, I.; Mahalu, D.; Frydman, V.; Sperling, J.; Yacoby, A.; Bar-Joseph, I. Nature 2005, 436, 677-680.
8. Salomon, A.; Cahen, D.; Lindsay, S.; Tomfohr, J.; Engelkes, V. B.; Frisbie, C. D. Adv. Mater. 2003, 15, 1881-1890.
9. Katz, E.; Willner, I. Angew. Chem., Int. Ed. 2004, 3, 6042-6108.
10. Datta, S. Nanotechnology 2004, 15, S433-S451.
11. Tran, E.; Rampi, M. A.; Whitesides, G. M. Angew. Chem., Int. Ed. 2004, 43, 3835-3839.
12. Cazaux, J. J. Electron Spectrosc. Relat. Phenom. 1999, 105, 155-185.
13. Lau, W. M. Appl. Phys. Lett. 1989, 54, 338-340.
14. Cohen, H. Appl. Phys. Lett. 2004, 85, 1271-1273.
15. Doron-Mor, I.; Hatzor, A.; Vaskevich, A.; van der Boom-Moav, T.; Shanzer, A.; Rubinstein, I.; Cohen, H. Nature 2000, 406, 382-385.
16. Shabtai, K.; Rubinstein, I.; Cohen, S. R.; Cohen, H. J. Am. Chem. Soc. 2000, 122, 4959-4962.
17. Cohen, H.; Nogues, C.; Zon, I.; Lubomirsky, I. J. Appl. Phys. 2005, 97, 113701/1-113701/5.
18. Cohen, H.; Zenkina, O. V.; Shukla, A. D.; van der Boom, M. E. J. Phys. Chem. B 2006, 110, 1506-1508.
19. Frydman, E.; Cohen, H.; Maoz, R.; Sagiv, J. Langmuir 1997, 13, 5089-5106.
20. Filip-Granit, N.; Yerushalmi, R.; Brandis, A.; van der Boom, M. A.; Scherz, A. J. Phys. Chem. B 2005, 109, 6933-6935.
21. Gulino, A.; Condorelli, G. G.; Mineo, P.; Fragala, I. Nanotechnology 2005, 16, 2170-2175.
22. Lin, W.; Lin, W.; Wong, G. K.; Marks, T. J. J. Am. Chem. Soc. 1996, 118, 8034-8042.
23. Facchetti, A.; Abbotto, A.; Beverina, L.; van der Boom, M. E.; Dutta, P.; Evmenenko, G.; Pagani, G.; A. Marks, T. J. Chem. Mater. 2003, 15, 1064-1072.
24. Nitzan, A.; Galperin, M.; Ingold, G. L.; Grabert, H. J. Chem. Phys. 2002, 117, 10837-10841.
25. Noy, D.; Yerushalmi, R.; Brumfeld, V.; Ashur, I.; Scheer, H.; Baldridge, K. K.; Scherz, A. J. Am. Chem. Soc. 2000, 122, 3937-3944.
26. Yerushalmi, R.; Scherz, A.; Baldridge, K. K. J. Am. Chem. Soc. 2004, 126, 5897-5905.