XPS studies of SiO2/Si system under external bias

Journal of Physical Chemistry B

Volumn 107, Issue 13, 2003, Pages 2939-2943

  Ulgut, Burak ^a   Suzer, Sefik ^a  

^a BILKENT UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

EXTERNAL BIAS; SQUARE WAVE BIAS; STRAY ELECTRONS;

BINDING ENERGY; ELECTRONS; GROWTH (MATERIALS); SILICA; SILICON; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERFACES (MATERIALS);

EID: 0038056020     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp022003z     Document Type: Article

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