Transient charge accumulation in a capacitive self-assembled monolayer

Nano Letters

Volumn 6, Issue 11, 2006, Pages 2462-2466

  Cohen, Hagai ^a   Maoz, Rivka ^a   Sagiv, Jacob ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; ELECTRON SPECTROSCOPY; LEAKAGE CURRENTS; ORGANOMETALLICS; SELF ASSEMBLY; SILICON; TRANSIENTS;

ORGANIC LAYER; ORGANOSILANE; QUANTUM SIZE EFFECTS; TRANSIENT CHARGE ACCUMULATION;

ELECTRIC CHARGE;

SILANE DERIVATIVE; SILICON;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SENSITIVITY AND SPECIFICITY; SPECTROPHOTOMETRY; SURFACE PROPERTY; TIME; X RAY;

ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; PARTICLE SIZE; SENSITIVITY AND SPECIFICITY; SILANES; SILICON; SPECTROPHOTOMETRY; SURFACE PROPERTIES; TIME FACTORS; X-RAYS;

EID: 33846138698     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl061749w     Document Type: Article

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