Identification of van Hove singularities in the GaN dielectric function: A comparison of the cubic and hexagonal phase

Physica Status Solidi (B) Basic Research

Volumn 246, Issue 7, 2009, Pages 1440-1449

  Cobet, C ^a   Goldhahn, R ^b   Richter, W ^c   Esser, N ^a  

^a ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^c Dipartimento di Fisica   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67849122843     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200945200     Document Type: Article

References (56)

1. W. R. L. Lambrecht, B. Segall, J. Rife, W. R. Hunter, and D. K. Wickende, Phys. Rev. B 51(19), 13516-13532 (1995).
2. W. R. L. Lambrecht and S. N. Rashkeev, Phys. Status Solidi B 217(1), 599-640 (2000).
3. W. R. L. Lambrecht and M. Prikhodko, Solid State Commun. 121(9/10), 549-554 (2002).
4. R. Goldhahn, C. Buchheim, P. Schly, A. T. Winzer, and H. Wenzel, Optical constants of bulk nitrides, in: Nitride Semiconductor Devices, edited by J. Piprek (Wiley-VCH Verlag, 2007).
5. H. Morkoc, Nitride Semiconductors and Devices (Springer-Verlag, Berlin, 1999).
6. V. Y. Davydov and A. A. Klochikhin, Semiconductors 38(8), 861-898 (2004).
7. O. Ambacher, J. Majewski, C. Miskys, A. Link, M. Hermann, M. Eickhoff, M. Stutzmann, F. Bernardini, V. Fiorentini, V. Tilak, B. Schaff, and L. Eastman, J. Phys.: Condens. Matter 14(13), 3399-3434 (2002).
8. S. C. Jain, M. Willander, J. Narayan, and R. V. Overstraeten, J. Appl. Phys. 87(3), 965-1006 (2000).
9. I. Vurgaftman and J. R. Meyer, J. Appl. Phys. 94(6), 3675- 3696 (2003).
10. S. Nakamura and G. Fasol, The Blue Laser Diode (Springer-Verlag, Berlin, Heidelberg, New York, 1997).
11. F. Bechstedt, J. Furthmüller, M. Ferhat, L. K. Teles, L. M. R. Scolfaro, J. R. Leite, V. Y. Davydov, O. Ambacher, and R. Goldhahn, Phys. Status Solidi A 195(3), 628-633 (2003).
12. Q. Guo, O. Kato, M. Fujisawa, and A. Yoshida, Solid State Commun. 83(7), 721-723 (1992).
13. R. Goldhahn, Acta Phys. Pol. A 104(2), 123-147 (2003).
14. J. Petalas, S. Logothetidis, S. Boultadakis, M. Alouani, and J. M. Wills, Phys. Rev. B 52(11), 8082-8091 (1995).
15. U. Köhler, D. J. As, B. Schöttker, T. Frey, K. Lischka, J. Scheiner, S. Shokhovets, and R. Goldhahn, J. Appl. Phys. 85(1), 404-407 (1999).
16. N. V. Edwards, M. D. Bremser, T. W. Weeks, R. S. Kern, R. F. Davis, and D. E. Aspnes, Appl. Phys. Lett. 69(14), 2065-2067 (1996).
17. G. Yu, G. Wang, H. Ishikawa, M. Umeno, T. Soga, T. Egawa, J. Watanabe, and T. Jimbo, Appl. Phys. Lett. 70(24), 3209-3211 (1997).
18. R. Goldhahn, A. T. Winzer, V. Cimalla, O. Ambacher, C. Cobet, W. Richter, N. Esser, J. Furthmüller, F. Bechstedt, H. Luf, and W. J. Schaff, Superlattices Microstruct. 36, 591-597 (2004).
19. J. Barth, R. L. Johnson, and M. Cardona, Spectroscopic ellipsometry in the 6-35 eV region, in: Handbook of Optical Constants of Solids, edited by E. D. Palik (Academic Press, Orlando, 1991), pp. 213-246.
20. R. L. Johnson, J. Barth, M. Cardona, D. Fuchs, and A. M. Bradshaw, Nucl. Instrum. Methods Phys. Res. A 290, 606-612 (1990).
21. H. G. Tompkins and E. A. Irene, Handbook of Ellipsometry (William Andrew Publishing, Norwich, 2005).
22. S. Logothetidis, J. Petalas, M. Cardona, and T. D. Moustakas, Phys. Rev. B 50(24), 18017-18029 (1994).
23. T. Wethkamp, K. Wilmers, C. Cobet, N. Esser, W. Richter, O. Ambacher, M. Stutzmann, and M. Cardona, Phys. Rev. B 59(3), 1845-1849 (1999).
24. T. Wethkamp, K. Wilmers, N. Esser, W. Richter, O. Ambacher, H. Angerer, G. Jungk, R. L. Johnson, and M. Cardona, Thin Solid Films 313/314, 745-750 (1998).
25. L. X. Benedict, T. Wethkamp, K. Wilmers, C. Cobet, N. Esser, E. L. Shirley, W. Richter, and M. Cardona, Solid State Commun. 112(3), 129-133 (1999).
26. C. Cobet, N. Esser, J. T. Zettler, W. Richter, P. Waltereit, O. Brandt, K. H. Ploog, S. Peters, N. V. Edwards, O. P. A. Lindquist, and M. Cardona, Phys. Rev. B 64, 165203 (2001).
27. V. G. Horton, E. T. Arakawa, R. N. Hamm, and M. W. Williams, Appl. Opt. 8(3), 667-670 (1996).
28. M. Yang, C. Cobet, C. Werner, and N. Esser, Appl. Phys. Lett. 92, 011110 (2008).
29. P. Waltereit, O. Brandt, M. Ramsteiner, R. Uecker, P. Reiche, and K. H. Ploog, J. Cryst. Growth 218, 143 (2000).
30. P. Waltereit, O. Brandt, M. Ramsteiner, R. Uecker, P. Reiche, and K. H. Ploog, Phys. Status Solidi A 180, 133-138 (2000).
31. C. Cobet, K. Wilmers, T. Wethkamp, N. V. Edwards, N. Esser, and W. Richter, Thin Solid Films 364, 111-113 (2000).
32. D. J. As, D. Schikora, and K. Lischka, Phys. Status Solidi C 0(6), 1607-1626 (2003).
33. X. L. Suna, Y. T. Wang, H. Yang, J. B. Li, L. X. Zheng, D. P. Xu, and Z. G. Wang, Thin Solid Films 368, 237-240 (2000).
34. D. E. Aspnes, J. Opt. Soc. Am. 70(10), 1275-1277 (1980).
35. R. M. A. Azzam and N. B. Bashara, Ellipsometry and polarized light, paperback edition (North-Holland Personal Library, Amsterdam, 1987).
36. G. Bauer and W. Richter, Optical characterization of epitaxial semiconductor layers (Springer-Verlag, Berlin, 1996).
37. D. W. Berreman, J. Opt. Soc. Am. 62(4), 502 (1972).
38. M. Schubert, Phys. Rev. B 53(8), 4265-4274 (1996).
39. D. A. G. Bruggeman, Ann. Phys. (Leipzig) 24, 636-679 (1935).
40. D. E. Aspnes, J. B. Theeten, and F. Hottier, Phys. Rev. B 20(8), 3292-3302 (1979).
41. M. Cardona and D. L. Greenaway, Phys. Rev. 125(4), 1291-1296 (1962).
42. M. Cardona and D. L. Greenaway, Phys. Rev. 131(1), 98-103 (1963).
43. M. Cardona, Modulation spectroskopy, in: Solid State Physics, edited by F. Seitz, D. Turnbell, and H. Ehrenreich, (Academic Press, New York, 1969).
44. D. E. Aspnes, Modulation spectroscopy/electric field effects on the dielectric function of semiconductors, in: Handbook On Semiconductors, edited by T. S. Moss (North-Holland Publishing Company, Amsterdam, 1980), pp. 109-154.
45. Y. Toyozawa, M. Inoue, T. Inui, M. Okazaki, and E. Hanamura, J. Phys. Soc. Jpn. 22, 1337-1349 (1967).
46. M. Cardona, J. Appl. Phys. 36(7), 2181 (1965).
47. M. Cardona and G. Harbeke, Phys. Rev. 137(5A), A1467-1476 (1964).
48. M. Cardona, Solid State Commun. 1, 109 (1963).
49. J. L. Birman, Phys. Rev. 115(6), 1493-1505 (1959).
50. M. Cardona and G. Harbeke, Phys. Rev. 137(5A), A1467 (1965).
51. T. K. Bergstresser and M. L. Cohen, Phys. Rev. 164(3), 1069-1080 (1967).
52. F. Bechstedt, J. Furthmüller, and J. M. Wagner, Phys. Status Solidi C 0(6), 1732-1749 (2003).
53. M. Cardona and N. E. Christensen, Solid State Commun. 116(8), 421-425 (2000).
54. N. V. Edwards, S. D. Yoo, M. D. Bremser, J. T. W. Weeks, O. H. Nam, R. F. Davis, H. Liu, R. A. Stall, M. N. Horton, N. R. Perkins, T. F. Kuech, and D. E. Aspnes, Appl. Phys. Lett. 70(15), 2001-2003 (1997).
55. C. Buchheim, R. Goldhahn, M. Rakel, C. Cobet, N. Esser, U. Rossow, D. Fuhrmann, and A. Hangleiter, Phys. Status Solidi B 242(13), 2610-2616 (2005).
56. S. Ghosh, P. Waltereit, O. Brandt, H. T. Grahn, and K. H. Ploog, Appl. Phys. Lett. 80(3), 413-415 (2002).