Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78-4.77 eV) by spectroscopic ellipsometry and the optical transmission method

Applied Physics Letters

Volumn 70, Issue 24, 1997, Pages 3209-3211

  Yu, G ^a   Wang, G ^a   Ishikawa, H ^a   Umeno, M ^a   Soga, T ^a   Egawa, T ^a   Watanabe, J ^a   Jimbo, T ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIA; ELLIPSOMETRY; LIGHT ABSORPTION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NITROGEN; NUMERICAL METHODS; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; REFRACTIVE INDEX; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SUBSTRATES;

MEAN SQUARE ERROR; SELLMIER DISPERSION EQUATION; SPECTROSCOPIC ELLIPSOMETRY;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0031169294     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119157     Document Type: Article

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