Dielectric function of hexagonal aln films determined by spectroscopic ellipsometry in the vacuum-uv spectral range

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 3, 1999, Pages 1845-1849

  Cardona, M ^a   Stutzmann, M ^c   Richter, W ^b  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^c WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001674558     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.1845     Document Type: Article

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