Anisotropy of the dielectric function for wurtzite InN

Superlattices and Microstructures

Volumn 36, Issue 4-6, 2004, Pages 591-597

  Goldhahn, R ^a   Winzer, A T ^a   Cimalla, V ^a   Ambacher, O ^a   Cobet, C ^b   Richter, W ^b   Esser, N ^c   Furthmuller J ^d   Bechstedt, F ^d   Lu, H ^e   Schaff, W J ^e  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^c Department Berlin   (Germany)

^d FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^e Cornell University   (United States)

Author keywords

Anisotropy; Dielectric function; Ellipsometry; InN

Indexed keywords

ANISOTROPY; DATA REDUCTION; DIELECTRIC PROPERTIES; ELECTRIC FIELDS; ELECTRON DIFFRACTION; ELECTRON ENERGY LEVELS; ELLIPSOMETRY; FILM GROWTH; GALLIUM NITRIDE; METALLORGANIC VAPOR PHASE EPITAXY; MOLECULAR BEAM EPITAXY; TENSORS; X RAY DIFFRACTION ANALYSIS;

BRILLOUIN ZONES; DIELECTRIC FUNCTION CALCULATIONS; OPTICAL ANISOTROPY; OPTICAL TRANSITIONS; SPECTROSCOPIC ELLIPSOMETRY;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 9944265712     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2004.09.016     Document Type: Article

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