Variation of GaN valence bands with biaxial stress and quantification of residual stress

Applied Physics Letters

Volumn 70, Issue 15, 1997, Pages 2001-2003

  Edwards, N V ^a   Yoo, S D ^a   Bremser, M D ^a   Weeks Jr , T W ^a   Nam, O H ^a   Davis, R F ^a   Liu, H ^b,e   Stall, R A ^b   Horton, M N ^c   Perkins, N R ^c   Kuech, T F ^c   Aspnes, D E ^d  

^a North Carolina State University   (United States)

^b EMCORE CORPORATION   (United States)

^c University of Wisconsin Madison   (United States)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

^e HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5944259038     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119089     Document Type: Article

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