Proximity effects in free-standing EBID structures

Nanotechnology

Volumn 20, Issue 28, 2009, Pages

  Burbridge, Daniel J ^a   Gordeev, Sergey N ^a  

^a University of Bath   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM-INDUCED DEPOSITION; PRIMARY ELECTRON BEAMS; PROXIMITY EFFECTS;

ELECTRON BEAMS;

PLANTS (BOTANY);

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL MODIFICATION; CHEMICAL REACTION; CHEMICAL STRUCTURE; ELECTRICITY; ELECTRON BEAM; ELECTRON RADIATION; NANOFABRICATION; PRIORITY JOURNAL; THICKNESS; CHEMISTRY; METHODOLOGY; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; ULTRASTRUCTURE;

NANOMATERIAL;

MICROSCOPY, ELECTRON, SCANNING; NANOSTRUCTURES; NANOTECHNOLOGY;

EID: 67651176163     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/28/285308     Document Type: Article

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