On voltage acceleration models of time to breakdown - Part I: Experimental and analysis methodologies

IEEE Transactions on Electron Devices

Volumn 56, Issue 7, 2009, Pages 1433-1441

  Wu, Ernest Y ^a   Suñé, Jordi ^b  

^a IBM MICROELECTRONICS   (United States)

^b UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

Dielectric breakdown; Reliability projection; Voltage acceleration models

Indexed keywords

ACCELERATION MODELS; AREA SCALING; DIELECTRIC BREAKDOWN; DIELECTRIC BREAKDOWNS; DIRECT TUNNELING; E-MODEL; EXPERIMENTAL METHODOLOGY; EXPONENTIAL LAW; FOWLER-NORDHEIM TUNNELING; POWER LAW; POWER LAW MODEL; RELIABILITY PROJECTION; V-MODEL; VOLTAGE ACCELERATION; VOLTAGE ACCELERATION MODELS;

ACCELERATION; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; ELECTRON TUBE DIODES; TUNNELING (EXCAVATION); WIND TUNNELS;

LEAKAGE CURRENTS;

EID: 67650131364     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2009.2021721     Document Type: Article

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