Field acceleration for oxide breakdown - can an accurate anode hole injection model resolve the E vs. 1/E controversy?

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2000, Pages 21-26

  Alam, Muhammad A ^a   Bude, Jeff ^a   Ghetti, Andrea ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC POTENTIAL; EXTRAPOLATION; OXIDES; RELIABILITY; SEMICONDUCTOR DEVICE MODELS;

ANODE HOLE INJECTION (AHI) MODELS;

GATES (TRANSISTOR);

EID: 0033733540     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (18)