Characterization of electrochemically grafted molecular layers on silicon for electronic device applications

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  Scott, Adina ^a   Janes, David B ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC DEVICES; HEAD GROUPS; IN-SITU; IN-SITU SPECTROSCOPIES; METALLIZATION; MODIFIED SURFACES; MOLECULAR LAYERS; ORGANICALLY FUNCTIONALIZED; PHYSICAL MECHANISMS; SILICON OXIDATIONS; SILICON SURFACES; SPECTROSCOPIC METHODS; SUBMONOLAYER; SURFACE ANALYSIS TECHNIQUES;

APPLICATIONS; GRAFTING (CHEMICAL); MOLECULAR SPECTROSCOPY; NONMETALS; SEMICONDUCTING FILMS; SEMICONDUCTOR QUANTUM DOTS; SILICA; SILICON COMPOUNDS; SURFACE ANALYSIS; THERMOELECTRIC EQUIPMENT;

MOLECULAR ORIENTATION;

EID: 65249161631     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3103337     Document Type: Article

References (54)

1. D. K. Aswal, S. Lenfant, D. Guerin, J. V. Yakhmi, and D. Vuillaume, Anal. Chim. Acta 568, 84 (2006).
2. P. Allongue, C. H. de Villeneuve, and J. Pinson, Electrochim. Acta 45, 3241 (2000).
3. A. Bansal and N. S. Lewis, J. Phys. Chem. B 102, 1067 (1998).
4. A. Faucheux, A. C. Gouget-Laemmel, P. Allongue, C. H. de Villeneuve, F. Ozanam, and J.-N. Chazalviel, Langmuir 23, 1326 (2007).
5. J. M. Buriak, Chem. Commun. (Cambridge) 1999, 1051.
6. J. M. Buriak, Chem. Rev. (Washington, D.C.) 102, 1272 (2002).
7. M. R. Linford, P. Fenter, P. M. Eisenberger, and C. E. D. Chidsey, J. Am. Chem. Soc. 117, 3145 (1995).
8. R. Boukherroub, S. Morin, D. D. M. Wayner, F. Bensebaa, G. I. Sproule, J. M. Baribeau, and D. J. Lockwood, Chem. Mater. 13, 2002 (2001).
9. A. Bansal, X. Li, I. Lauermann, N. S. Lewis, S. I. Yi, and W. H. Weinberg, J. Am. Chem. Soc. 118, 7225 (1996).
10. R. Boukherroub, S. Morin, F. Bensebaa, and D. D. M. Wayner, Langmuir 15, 3831 (1999).
11. S. Fellah, A. Teyssot, F. Ozanam, J.-N. Chazalviel, J. Vegneron, and A. Etcheberry, Langmuir 18, 5851 (2002).
12. R. L. Cicero, M. R. Linford, and C. E. D. Chidsey, Langmuir 16, 5688 (2000).
13. J. M. Tour, L. J. II, D. L. Pearson, J. J. S. Lamba, T. P. Bugin, G. M. Whitesides, D. L. Allara, A. N. Parkh, and S. V. Atre, J. Am. Chem. Soc. 117, 9529 (1995).
14. C. H. de Villeneuve, J. Pinson, M. C. Bernard, and P. Allongue, J. Phys. Chem. B 101, 2415 (1997).
15. D. V. Kosynkin and J. M. Tour, Org. Lett. 3, 993 (2001).
16. M. P. Stewart, F. Maya, D. V. Kosynkin, S. M. Dirk, J. J. Stapleton, C. L. McGuiness, D. L. Allara, and J. M. Tour, J. Am. Chem. Soc. 126, 370 (2004).
17. P. Allongue, C. H. de Villeneuve, J. Pinson, F. Ozanam, J. N. Chazalviel, and X. Wallart, Electrochim. Acta 43, 2791 (1998).
18. R. Basu, C. R. Kinser, J. D. Tovar, and M. C. Hersam, Chem. Phys. 326, 144 (2006).
19. D. Pandey, D. Y. Zemlyanov, K. Bevan, R. G. Reifenberger, S. M. Dirk, S. W. Howell, and D. R. Wheeler, Langmuir 23, 4700 (2007).
20. C. L. McGuiness, D. Blasini, J. P. Masejewski, S. Uppili, O. M. Cabarcos, D. Smilgies, and D. L. Allara, ACS Nano 1, 30 (2007).
21. P. Allongue, C. H. de Villeneuve, G. Cherouvrier, R. Cortes, and M.-C. Bernard, J. Electroanal. Chem. 550-551, 161 (2003).
22. F. Anariba, S. H. DuVall, and R. L. McCreery, Anal. Chem. 75, 3837 (2003).
23. M. Gensch, K. Roodenko, K. Hinrichs, R. Hunger, A. G. Güell, A. Merson, U. Schade, Y. Shapira, T. Dittrich, J. Rappich, and N. Esser, J. Vac. Sci. Technol. B 23, 1838 (2005).
24. K. Roodenko, J. Rappich, M. Gensch, N. Esser, and K. Hinrichs, Appl. Phys. A: Mater. Sci. Process. 90, 175 (2008).
25. A. Scott, D. B. Janes, C. Risko, and M. A. Ratner, Appl. Phys. Lett. 91, 033508 (2007).
26. A. Vilan, A. Shanzer, and D. Cahen, Nature (London) 404, 166 (2000).
27. H. Haick, M. Ambrico, T. Ligonzo, R. T. Tung, and D. Cahen, J. Am. Chem. Soc. 128, 6854 (2006).
28. H. Haick, O. Niitsoo, J. Ghabboun, and D. Cahen, J. Phys. Chem. C 111, 2318 (2007).
29. A. V. Walker, T. B. Tighe, J. Stapleton, B. C. Haynie, S. Uppili, D. L. Allara, and N. Winograd, Appl. Phys. Lett. 84, 4008 (2004).
30. G. Nagy and A. V. Walker, J. Phys. Chem. B 110, 12543 (2006).
31. W. Wang, A. Scott, N. Gergel-Hackett, C. Hacker, D. B. Janes, and C. Richter, Nano Lett. 8, 919 (2008).
32. C. A. Richter, C. A. Hacker, L. J. Richter, O. A. Kirillov, J. S. Suehle, and E. M. Vogel, Solid-State Electron. 50, 1088 (2006).
33. G. S. Higashi, Y. J. Chabal, G. W. Trucks, and K. Raghavachari, Appl. Phys. Lett. 56, 656 (1990).
34. P. Jakob and Y. J. Chabal, J. Chem. Phys. 95, 2897 (1991).
35. C. P. Wade and C. E. D. Chidsey, Appl. Phys. Lett. 71, 1679 (1997).
36. M. R. Houston and R. Maboudian, J. Appl. Phys. 78, 3801 (1995).
37. P. Hartig, J. Rappich, and T. Dittrich, Appl. Phys. Lett. 80, 67 (2002).
38. R. M. Metzger, T. Xu, and I. R. Peterson, J. Phys. Chem. B 105, 7280 (2001).
39. S. Lodha and D. B. Janes, Appl. Phys. Lett. 85, 2809 (2004).
40. N. Fairley, CASAXPS software version 2.3.12.
41. NIST XPS database, URL http://srdata.nist.gov/xps.
42. C. S. Fadley, R. J. Baird, W. Siekhaus, T. Novakov, and S. A. L. Bergstrom, J. Electron Spectrosc. Relat. Phenom. 4, 93 (1974).
43. P. J. Cumpson and M. P. Seah, Surf. Interface Anal. 25, 430 (1997).
44. M. Suzuki, H. Ando, Y. Higashi, H. Takenaka, H. Shimada, N. Matsubayashi, M. Imamura, S. Kurosawa, S. Tanuma, and C. J. Powell, Surf. Interface Anal. 29, 330 (2000).
45. R. Larsson and B. Folkesson, Chem. Scr. 9, 148 (1976).
46. J. Sharma, W. L. Garrett, F. J. Owens, and V. L. Vogel, J. Phys. Chem. 86, 1657 (1982).
47. D. Varsanyi, Assignments for Vibrational Spectra of Seven Hundred Benzene Derivatives (Wiley, New York, 1973).
48. R. M. Silverstein and F. X. Webster, Spectrometric Identification of Organic Compounds (Wiley, New York, 1998).
49. M. Avram and G. D. Mateescu, Infrared Spectroscopy: Applications in Organic Chemistry (Wiley, New York, 1972).
50. A. V. Walker, T. B. Tighe, O. Cabarcos, M. D. Reinard, S. Uppili, B. C. Haynie, N. Winograd, and D. L. Allara, J. Am. Chem. Soc. 126, 3954 (2004).
51. A. Scott, C. A. Hacker, and D. B. Janes, J. Phys. Chem. C 112, 14021 (2008).
52. C. A. Richter, C. A. Hacker, and L. J. Richter, J. Phys. Chem. B 109, 21836 (2005).
53. W. Wang, T. Lee, I. Kretzschmar, and M. A. Reed, Nano Lett. 4, 643 (2004).
54. J. M. Beebe, H. J. Moore, T. R. Lee, and J. G. Kushmerick, Nano Lett. 7, 1364 (2007).