UHV STM I(V) and XPS studies of aryl diazonium molecules assembled on Si(111)

Langmuir

Volumn 23, Issue 9, 2007, Pages 4700-4708

  Pandey, Deepak ^a   Zemlyanov, Dmitry Y ^a   Bevan, Kirk ^a   Reifenberger, Ronald G ^a   Dirk, Shawn M ^b   Howell, Steve W ^b   Wheeler, D R ^b  

^a PURDUE UNIVERSITY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

4 METHYLBENZENEDIAZONIUM TETRAFLUOROBORATE; MOLECULAR LAYER; STM IMAGING; TIP SUBSTRATE SEPARATIONS;

DATA ACQUISITION; IMAGING TECHNIQUES; LOCAL DENSITY APPROXIMATION; SELF ASSEMBLED MONOLAYERS; UHV POWER TRANSMISSION; X RAY PHOTOELECTRON SPECTROSCOPY;

NITROGEN COMPOUNDS;

DIAZONIUM COMPOUND; HYDROGEN; SILICON;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; METHODOLOGY; SCANNING TUNNELING MICROSCOPY; SPECTROPHOTOMETRY; SURFACE PROPERTY; SYNTHESIS; X RAY;

DIAZONIUM COMPOUNDS; HYDROGEN; MICROSCOPY, SCANNING TUNNELING; MODELS, CHEMICAL; MOLECULAR STRUCTURE; SILICON; SPECTROPHOTOMETRY; SURFACE PROPERTIES; X-RAYS;

EID: 34248348605     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la063235i     Document Type: Article

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