Molecule-solid interfaces studied with infrared ellipsometry: Ultrathin nitrobenzene films

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 23, Issue 4, 2005, Pages 1838-1842

  Gensch, M ^a   Roodenko, K ^a   Hinrichs, K ^a   Hunger, R ^b   Guell A G ^c   Merson, A ^d   Schade, U ^e   Shapira, Y ^d   Dittrich, Th ^e   Rappich, J ^e   Esser, N ^a  

^a ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c UNIVERSITY OF BARCELONA   (Spain)

^d TEL AVIV UNIVERSITY   (Israel)

^e HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; INFRARED SPECTROSCOPY; MONOLAYERS; SILICON COMPOUNDS; SURFACE CHEMISTRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

INFRARED ELLIPSOMETRY; THIN ORGANIC FILMS;

BENZENE;

EID: 28444488485     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1947801     Document Type: Article

References (22)

1. K. Hinrichs, M. Gensch, N. Esser, and A. Röseler, J. Phys.: Condens. Matter 16, S4335 (2004).
2. P. Hartig, J. Rappich, and Th. Dittrich, Appl. Phys. Lett. 80, 67 (2002).
3. C. H. Villeneuve, J. Pinson, and P. Allongue, J. Phys. Chem. B 101, 2415 (1997).
4. C. H. Villeneuve, J. Pinson, F. Ozanam, J. N. Chazalviel, and P. Allongue, Mater. Res. Soc. Symp. Proc. 451, 185 (1997).
5. A. Merson, Th. Dittrich, Y. Zidon, J. Rappich, and Y. Shapira, Appl. Phys. Lett. 85, 1075 (2004).
6. J. Krüger, U. Bach, and M. Grätzel, Adv. Mater. (Weinheim, Ger.) 12, 447 (2000).
7. See, for example, a review of J. M. Buriak, Chem. Rev. (Washington, D.C.) 102, 1271 (2002).
8. S. Heid, F. Effenberger, K. Bierbaum, and M. Grunze, Langmuir 12, 2118 (1996).
9. See, for example, a review of U. Diebold, Surf. Sci. Rep. 48, 53 (2003).
10. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
11. A. Röseler and E. H. Korte, in Handbook of Vibrational Spectroscopy, edited by, P. R. Griffiths, and, J. Chalmers, (Wiley, Chichester, 2001), Vol. 2, pp. 1065-1090.
12. A. Röseler, Thin Solid Films 234, 307 (1993).
13. U. Schade, A. Röseler, E. H. Korte, F. Bartl, K. P. Hofmann, T. Noll, and W. B. Peatman, Rev. Sci. Instrum. 73, 1568 (2002).
14. M. Gensch, K. Hinrichs, A. Röseler, E. H. Korte, and U. Schade, Anal. Bioanal. Chem. 376, 626 (2003).
15. K. Hinrichs, M. Gensch, A. Röseler, E. H. Korte, K. Sahre, K. J. Eichhorn, N. Esser, and U. Schade, Appl. Spectrosc. 57, 1250 (2003).
16. Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy, edited by, D. Briggs, and, M. P. Seah, (Wiley, Chichester, 1983).
17. D. Syomin, J. Wang, and B. E. Koel, Surf. Sci. Lett. 495, L827 (2001).
18. J. Clarkson and W. E. Smith, J. Mol. Struct. 655, 413 (2003).
19. P. Allongue, C. H. Villeneuve, J. Pinson, F. Ozanam, J. N. Chazaviel, and X. Wallart, Electrochim. Acta 43, 2791 (1998).
20. J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, Handbook of X-Ray Photoelectron Spectroscopy, edited by, J. Chastain, and, R. C. King, Jr., (Physical Electronics, Inc., Eden Prairie, Minnessota, 1995).
21. G. Distefano, M. Guerra, D. Jones, A. Modelli, and F. P. Colonna, Chem. Phys. 52, 389 (1980).
22. K. Hinrichs, A. Röseler, M. Gensch, and E. H. Korte, Thin Solid Films 455-456, 266 (2004).